Focused ion beam imaging of laser ablation sub-surface effects on layered materials

Helena Téllez, José M. Vadillo, Richard J. Chater, J. Javier Laserna, David S. McPhail

    Research output: Contribution to journalArticlepeer-review

    5 Citations (Scopus)

    Abstract

    The focussed ion beam (FIB) represents a useful and versatile tool to allow visualization of sub-surface features related to the thermal effects of laser-target interaction with high spatial resolution. The possibility of performing a contamination-free milling process on specific sample locations provides significant advantage over conventional metallurgical procedures involving cutting and polishing. In particular, the direct visualization of the thermal features occurring at fluences below the phase explosion allows a deeper understanding of the extension of the laser heat-affected zone, the sub-surface alloying processes and additional features related to the photo-thermal mechanism of laser ablation.

    Original languageEnglish
    Pages (from-to)2265-2269
    Number of pages5
    JournalApplied Surface Science
    Volume255
    Issue number5 PART 1
    DOIs
    Publication statusPublished - Dec 30 2008

    All Science Journal Classification (ASJC) codes

    • Chemistry(all)
    • Condensed Matter Physics
    • Physics and Astronomy(all)
    • Surfaces and Interfaces
    • Surfaces, Coatings and Films

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