Focused ion beam imaging of laser ablation sub-surface effects on layered materials

Helena Tellez Lozano, José M. Vadillo, Richard J. Chater, J. Javier Laserna, David S. McPhail

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

The focussed ion beam (FIB) represents a useful and versatile tool to allow visualization of sub-surface features related to the thermal effects of laser-target interaction with high spatial resolution. The possibility of performing a contamination-free milling process on specific sample locations provides significant advantage over conventional metallurgical procedures involving cutting and polishing. In particular, the direct visualization of the thermal features occurring at fluences below the phase explosion allows a deeper understanding of the extension of the laser heat-affected zone, the sub-surface alloying processes and additional features related to the photo-thermal mechanism of laser ablation.

Original languageEnglish
Pages (from-to)2265-2269
Number of pages5
JournalApplied Surface Science
Volume255
Issue number5 PART 1
DOIs
Publication statusPublished - Dec 30 2008

Fingerprint

Focused ion beams
Laser ablation
Visualization
Imaging techniques
Lasers
Heat affected zone
Polishing
Alloying
Thermal effects
Ion beams
Explosions
Contamination
Hot Temperature

All Science Journal Classification (ASJC) codes

  • Surfaces, Coatings and Films

Cite this

Tellez Lozano, H., Vadillo, J. M., Chater, R. J., Laserna, J. J., & McPhail, D. S. (2008). Focused ion beam imaging of laser ablation sub-surface effects on layered materials. Applied Surface Science, 255(5 PART 1), 2265-2269. https://doi.org/10.1016/j.apsusc.2008.07.082

Focused ion beam imaging of laser ablation sub-surface effects on layered materials. / Tellez Lozano, Helena; Vadillo, José M.; Chater, Richard J.; Laserna, J. Javier; McPhail, David S.

In: Applied Surface Science, Vol. 255, No. 5 PART 1, 30.12.2008, p. 2265-2269.

Research output: Contribution to journalArticle

Tellez Lozano, H, Vadillo, JM, Chater, RJ, Laserna, JJ & McPhail, DS 2008, 'Focused ion beam imaging of laser ablation sub-surface effects on layered materials', Applied Surface Science, vol. 255, no. 5 PART 1, pp. 2265-2269. https://doi.org/10.1016/j.apsusc.2008.07.082
Tellez Lozano H, Vadillo JM, Chater RJ, Laserna JJ, McPhail DS. Focused ion beam imaging of laser ablation sub-surface effects on layered materials. Applied Surface Science. 2008 Dec 30;255(5 PART 1):2265-2269. https://doi.org/10.1016/j.apsusc.2008.07.082
Tellez Lozano, Helena ; Vadillo, José M. ; Chater, Richard J. ; Laserna, J. Javier ; McPhail, David S. / Focused ion beam imaging of laser ablation sub-surface effects on layered materials. In: Applied Surface Science. 2008 ; Vol. 255, No. 5 PART 1. pp. 2265-2269.
@article{78837a318e3d4a849138d76fc30b9203,
title = "Focused ion beam imaging of laser ablation sub-surface effects on layered materials",
abstract = "The focussed ion beam (FIB) represents a useful and versatile tool to allow visualization of sub-surface features related to the thermal effects of laser-target interaction with high spatial resolution. The possibility of performing a contamination-free milling process on specific sample locations provides significant advantage over conventional metallurgical procedures involving cutting and polishing. In particular, the direct visualization of the thermal features occurring at fluences below the phase explosion allows a deeper understanding of the extension of the laser heat-affected zone, the sub-surface alloying processes and additional features related to the photo-thermal mechanism of laser ablation.",
author = "{Tellez Lozano}, Helena and Vadillo, {Jos{\'e} M.} and Chater, {Richard J.} and Laserna, {J. Javier} and McPhail, {David S.}",
year = "2008",
month = "12",
day = "30",
doi = "10.1016/j.apsusc.2008.07.082",
language = "English",
volume = "255",
pages = "2265--2269",
journal = "Applied Surface Science",
issn = "0169-4332",
publisher = "Elsevier",
number = "5 PART 1",

}

TY - JOUR

T1 - Focused ion beam imaging of laser ablation sub-surface effects on layered materials

AU - Tellez Lozano, Helena

AU - Vadillo, José M.

AU - Chater, Richard J.

AU - Laserna, J. Javier

AU - McPhail, David S.

PY - 2008/12/30

Y1 - 2008/12/30

N2 - The focussed ion beam (FIB) represents a useful and versatile tool to allow visualization of sub-surface features related to the thermal effects of laser-target interaction with high spatial resolution. The possibility of performing a contamination-free milling process on specific sample locations provides significant advantage over conventional metallurgical procedures involving cutting and polishing. In particular, the direct visualization of the thermal features occurring at fluences below the phase explosion allows a deeper understanding of the extension of the laser heat-affected zone, the sub-surface alloying processes and additional features related to the photo-thermal mechanism of laser ablation.

AB - The focussed ion beam (FIB) represents a useful and versatile tool to allow visualization of sub-surface features related to the thermal effects of laser-target interaction with high spatial resolution. The possibility of performing a contamination-free milling process on specific sample locations provides significant advantage over conventional metallurgical procedures involving cutting and polishing. In particular, the direct visualization of the thermal features occurring at fluences below the phase explosion allows a deeper understanding of the extension of the laser heat-affected zone, the sub-surface alloying processes and additional features related to the photo-thermal mechanism of laser ablation.

UR - http://www.scopus.com/inward/record.url?scp=56949084617&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=56949084617&partnerID=8YFLogxK

U2 - 10.1016/j.apsusc.2008.07.082

DO - 10.1016/j.apsusc.2008.07.082

M3 - Article

AN - SCOPUS:56949084617

VL - 255

SP - 2265

EP - 2269

JO - Applied Surface Science

JF - Applied Surface Science

SN - 0169-4332

IS - 5 PART 1

ER -