Formation of a hybrid plasmonic waveguide mode probed by dispersion measurement

H. Saito, H. Kurata

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Hybrid waveguides, i.e., dielectric waveguides combined with plasmonic waveguides, have great potential for concomitantly exhibiting subwavelength confinement and long range propagation, enabling a highly integrated photonic circuit. We report the characterization of hybrid waveguide modes excited in Si/SiO2/Al films, by dispersion measurement using angle-resolved electron energy-loss spectroscopy. This experiment directly verifies the formation of the hybrid waveguide mode with a strongly localized electromagnetic field in a 6-nm-thick SiO2 layer. The results clearly describe the characteristic behavior of the hybrid waveguide mode, which depends on the effective index of the constituent dielectric waveguide and the surface plasmon-polariton modes.

Original languageEnglish
Article number133107
JournalJournal of Applied Physics
Volume117
Issue number13
DOIs
Publication statusPublished - Apr 7 2015
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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