Formation of a hybrid plasmonic waveguide mode probed by dispersion measurement

Hikaru Saito, H. Kurata

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Hybrid waveguides, i.e., dielectric waveguides combined with plasmonic waveguides, have great potential for concomitantly exhibiting subwavelength confinement and long range propagation, enabling a highly integrated photonic circuit. We report the characterization of hybrid waveguide modes excited in Si/SiO2/Al films, by dispersion measurement using angle-resolved electron energy-loss spectroscopy. This experiment directly verifies the formation of the hybrid waveguide mode with a strongly localized electromagnetic field in a 6-nm-thick SiO2 layer. The results clearly describe the characteristic behavior of the hybrid waveguide mode, which depends on the effective index of the constituent dielectric waveguide and the surface plasmon-polariton modes.

Original languageEnglish
Article number133107
JournalJournal of Applied Physics
Volume117
Issue number13
DOIs
Publication statusPublished - Apr 7 2015

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waveguides
dielectric waveguides
polaritons
electromagnetic fields
energy dissipation
photonics
electron energy
propagation
spectroscopy

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Formation of a hybrid plasmonic waveguide mode probed by dispersion measurement. / Saito, Hikaru; Kurata, H.

In: Journal of Applied Physics, Vol. 117, No. 13, 133107, 07.04.2015.

Research output: Contribution to journalArticle

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