Abstract
Hybrid waveguides, i.e., dielectric waveguides combined with plasmonic waveguides, have great potential for concomitantly exhibiting subwavelength confinement and long range propagation, enabling a highly integrated photonic circuit. We report the characterization of hybrid waveguide modes excited in Si/SiO2/Al films, by dispersion measurement using angle-resolved electron energy-loss spectroscopy. This experiment directly verifies the formation of the hybrid waveguide mode with a strongly localized electromagnetic field in a 6-nm-thick SiO2 layer. The results clearly describe the characteristic behavior of the hybrid waveguide mode, which depends on the effective index of the constituent dielectric waveguide and the surface plasmon-polariton modes.
| Original language | English |
|---|---|
| Article number | 133107 |
| Journal | Journal of Applied Physics |
| Volume | 117 |
| Issue number | 13 |
| DOIs | |
| Publication status | Published - Apr 7 2015 |
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All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)
Cite this
Formation of a hybrid plasmonic waveguide mode probed by dispersion measurement. / Saito, Hikaru; Kurata, H.
In: Journal of Applied Physics, Vol. 117, No. 13, 133107, 07.04.2015.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Formation of a hybrid plasmonic waveguide mode probed by dispersion measurement
AU - Saito, Hikaru
AU - Kurata, H.
PY - 2015/4/7
Y1 - 2015/4/7
N2 - Hybrid waveguides, i.e., dielectric waveguides combined with plasmonic waveguides, have great potential for concomitantly exhibiting subwavelength confinement and long range propagation, enabling a highly integrated photonic circuit. We report the characterization of hybrid waveguide modes excited in Si/SiO2/Al films, by dispersion measurement using angle-resolved electron energy-loss spectroscopy. This experiment directly verifies the formation of the hybrid waveguide mode with a strongly localized electromagnetic field in a 6-nm-thick SiO2 layer. The results clearly describe the characteristic behavior of the hybrid waveguide mode, which depends on the effective index of the constituent dielectric waveguide and the surface plasmon-polariton modes.
AB - Hybrid waveguides, i.e., dielectric waveguides combined with plasmonic waveguides, have great potential for concomitantly exhibiting subwavelength confinement and long range propagation, enabling a highly integrated photonic circuit. We report the characterization of hybrid waveguide modes excited in Si/SiO2/Al films, by dispersion measurement using angle-resolved electron energy-loss spectroscopy. This experiment directly verifies the formation of the hybrid waveguide mode with a strongly localized electromagnetic field in a 6-nm-thick SiO2 layer. The results clearly describe the characteristic behavior of the hybrid waveguide mode, which depends on the effective index of the constituent dielectric waveguide and the surface plasmon-polariton modes.
UR - http://www.scopus.com/inward/record.url?scp=84926482891&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84926482891&partnerID=8YFLogxK
U2 - 10.1063/1.4916800
DO - 10.1063/1.4916800
M3 - Article
AN - SCOPUS:84926482891
VL - 117
JO - Journal of Applied Physics
JF - Journal of Applied Physics
SN - 0021-8979
IS - 13
M1 - 133107
ER -