Formation of stacking-faults in atomic graphoepitaxial a-axis YBa2Cu3Ox thin films on (100) SrLaGaO4 substrates

Sh Miyazawa, Masashi Mukaida

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8 Citations (Scopus)

Abstract

The complicated crystalline microstructure of c-axis in-plane-aligned, a-axis oriented YBa2Cu3Ox thin films on K2NiF4-type (100) SrLaGaO4 substrates is discussed in relation to surface irregularities inherent in the (100) SrLaGaO4 substrate. Transmission electron microscopy reveals that interlattice planes of YBa2Cu3Ox shift by multiples of c/6 unit, resulting in anti-phase domain boundaries and stacking-faults. The formation of these defects can be correlated with the cobbled substrate surface and is modeled in terms of atomic steps on the cobbled surface based on our growth model named ″atomic graphoepitaxy″.

Original languageEnglish
JournalJapanese Journal of Applied Physics, Part 2: Letters
Volume35
Issue number9 B
Publication statusPublished - Dec 1 1996

Fingerprint

Stacking faults
crystal defects
Thin films
graphoepitaxy
Substrates
thin films
antiphase boundaries
irregularities
Crystalline materials
Transmission electron microscopy
Defects
transmission electron microscopy
microstructure
Microstructure
shift
defects

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

Cite this

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AU - Mukaida, Masashi

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N2 - The complicated crystalline microstructure of c-axis in-plane-aligned, a-axis oriented YBa2Cu3Ox thin films on K2NiF4-type (100) SrLaGaO4 substrates is discussed in relation to surface irregularities inherent in the (100) SrLaGaO4 substrate. Transmission electron microscopy reveals that interlattice planes of YBa2Cu3Ox shift by multiples of c/6 unit, resulting in anti-phase domain boundaries and stacking-faults. The formation of these defects can be correlated with the cobbled substrate surface and is modeled in terms of atomic steps on the cobbled surface based on our growth model named ″atomic graphoepitaxy″.

AB - The complicated crystalline microstructure of c-axis in-plane-aligned, a-axis oriented YBa2Cu3Ox thin films on K2NiF4-type (100) SrLaGaO4 substrates is discussed in relation to surface irregularities inherent in the (100) SrLaGaO4 substrate. Transmission electron microscopy reveals that interlattice planes of YBa2Cu3Ox shift by multiples of c/6 unit, resulting in anti-phase domain boundaries and stacking-faults. The formation of these defects can be correlated with the cobbled substrate surface and is modeled in terms of atomic steps on the cobbled surface based on our growth model named ″atomic graphoepitaxy″.

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