Free defect production efficiency for heavy ion irradiation estimated by loop growth measurements

T. Muroga, K. Mihara, Hideo Watanabe, N. Yoshida

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

The free defect production efficiency, which is the number of freely migrating defects divided by the total displacements, has been estimated for a Fe-16Cr-45Ni alloy during 4 MeV Cu ion irradiation as a relative value to that of 1 MeV electron irradiation by application of loop growth measurements. The bulk loop growth model was verified by examining dependence of the loop growth rate on temperature and damage rate during electron and ion irradiations. The relative efficiency derived by sequential electron and ion irradiations was close to that derived by radiation-induced segregation and radiation-enhanced diffusion.

Original languageEnglish
Pages (from-to)203-206
Number of pages4
JournalJournal of Nuclear Materials
Volume212-215
Issue numberPART 1
DOIs
Publication statusPublished - Jan 1 1994

Fingerprint

Heavy Ions
Electron irradiation
electron irradiation
Ion bombardment
ion irradiation
Heavy ions
heavy ions
Defects
defects
Radiation
radiation
damage
Temperature
temperature

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Materials Science(all)
  • Nuclear Energy and Engineering

Cite this

Free defect production efficiency for heavy ion irradiation estimated by loop growth measurements. / Muroga, T.; Mihara, K.; Watanabe, Hideo; Yoshida, N.

In: Journal of Nuclear Materials, Vol. 212-215, No. PART 1, 01.01.1994, p. 203-206.

Research output: Contribution to journalArticle

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