Grain size measurements in Mg-Al high pressure die castings using electron back-scattered diffraction (EBSD)

Amanda Bowles, Kazuhiro Nogita, Matthew Dargusch, Cameron Davidson, John Griffiths

Research output: Contribution to journalArticle

18 Citations (Scopus)

Abstract

Optical metallographic techniques for grain-size measurement give unreliable results for high pressure diecast Mg-Al alloys and electron back-scattered diffraction mapping (EBSD) provides a good tool for improving the quality of these measurements. An application of EBSD mapping to this question is described, and data for some castings are presented. Ion-beam milling was needed to prepare suitable samples, and this technique is detailed. As is well-known for high pressure die castings, the grain size distribution comprises at least two populations. The mean grain size of the fine-grained population was similar in both AZ91 and AM60 and in two casting thicknesses (2mm and 5mm) and, contrary to previously published reports, it did not vary with depth below the surface.

Original languageEnglish
Pages (from-to)3114-3119
Number of pages6
JournalMaterials Transactions
Volume45
Issue number11
DOIs
Publication statusPublished - Nov 2004

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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