Grid-based oneshot scan using dot-line pattern

Ryo Furukawa, Hiroshi Kawasaki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Oneshot scanning technique which is robust to subsurface scattering is proposed. The pattern consists of parallel lines, where dotted lines and solid lines are alternatively aligned. Experimental results of scanning real objects are shown to prove the effectiveness.

Original languageEnglish
Title of host publication3D Image Acquisition and Display
Subtitle of host publicationTechnology, Perception and Applications, 3D 2018
PublisherOSA - The Optical Society
ISBN (Electronic)9781557528209
DOIs
Publication statusPublished - Jan 1 2018
Event3D Image Acquisition and Display: Technology, Perception and Applications, 3D 2018 - Orlando, United States
Duration: Jun 25 2018Jun 28 2018

Publication series

NameOptics InfoBase Conference Papers
VolumePart F95-3D 2018

Other

Other3D Image Acquisition and Display: Technology, Perception and Applications, 3D 2018
CountryUnited States
CityOrlando
Period6/25/186/28/18

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

Cite this

Furukawa, R., & Kawasaki, H. (2018). Grid-based oneshot scan using dot-line pattern. In 3D Image Acquisition and Display: Technology, Perception and Applications, 3D 2018 (Optics InfoBase Conference Papers; Vol. Part F95-3D 2018). OSA - The Optical Society. https://doi.org/10.1364/3D.2018.3M3G.4