Ground state of the Si(0 0 1) surface revisited - Is seeing believing?

T. Uda, H. Shigekawa, Y. Sugawara, Seigi Mizuno, H. Tochihara, Y. Yamashita, J. Yoshinobu, K. Nakatsuji, Hiroshi Kawai, F. Komori

Research output: Contribution to journalReview article

38 Citations (Scopus)

Abstract

The stable structure of clean Si(0 0 1) surface around 100 K is the c(4 × 2) arrangement constructed by buckled dimers. This structure was widely accepted as the ground state in 1990's. The view was challenged at the beginning of 2000's by the observations of a p(2 × 1) structure below 20 K with scanning tunneling microscopy (STM). Recent experimental studies confirm that the dimer is buckled below 30 K. Large tip-surface interaction, and/or tunneling current induced dynamical effect are now experimentally evident in the STM images at low temperatures. Moreover, a current induced structure transformation is discovered below 40 K even in the study by low energy electron diffraction. Dynamical electronic and vibrational effects are theoretically studied for accounting the observation of a p(2 × 1) structure below 20 K.

Original languageEnglish
Pages (from-to)147-162
Number of pages16
JournalProgress in Surface Science
Volume76
Issue number6-8
DOIs
Publication statusPublished - Jan 1 2004

Fingerprint

Induced currents
Scanning tunneling microscopy
Dimers
Ground state
scanning tunneling microscopy
dimers
ground state
Low energy electron diffraction
surface reactions
electron diffraction
electronics
Temperature
energy

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Cite this

Uda, T., Shigekawa, H., Sugawara, Y., Mizuno, S., Tochihara, H., Yamashita, Y., ... Komori, F. (2004). Ground state of the Si(0 0 1) surface revisited - Is seeing believing? Progress in Surface Science, 76(6-8), 147-162. https://doi.org/10.1016/j.progsurf.2004.05.015

Ground state of the Si(0 0 1) surface revisited - Is seeing believing? / Uda, T.; Shigekawa, H.; Sugawara, Y.; Mizuno, Seigi; Tochihara, H.; Yamashita, Y.; Yoshinobu, J.; Nakatsuji, K.; Kawai, Hiroshi; Komori, F.

In: Progress in Surface Science, Vol. 76, No. 6-8, 01.01.2004, p. 147-162.

Research output: Contribution to journalReview article

Uda, T, Shigekawa, H, Sugawara, Y, Mizuno, S, Tochihara, H, Yamashita, Y, Yoshinobu, J, Nakatsuji, K, Kawai, H & Komori, F 2004, 'Ground state of the Si(0 0 1) surface revisited - Is seeing believing?', Progress in Surface Science, vol. 76, no. 6-8, pp. 147-162. https://doi.org/10.1016/j.progsurf.2004.05.015
Uda, T. ; Shigekawa, H. ; Sugawara, Y. ; Mizuno, Seigi ; Tochihara, H. ; Yamashita, Y. ; Yoshinobu, J. ; Nakatsuji, K. ; Kawai, Hiroshi ; Komori, F. / Ground state of the Si(0 0 1) surface revisited - Is seeing believing?. In: Progress in Surface Science. 2004 ; Vol. 76, No. 6-8. pp. 147-162.
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