Abstract
The growth and crystallographic analysis of tf-axis-oriented YBa2Cu3Ox (abbreviated to YBCO) grains in c-axis- oriented films on NdGa03 substrates is described, a-axis-oriented grains grow at high substrate temperatures and high oxygen pressures.Reflection high energy electron diffraction (RHEED) patterns and 0-scan (in-plane rotation) X-ray measurements reveal that the grains exhibit a twofold symmetry indicating independent b- and c-axis orientations in the surface plane.The in-plane orientation of ^-axis-oriented grains is thought to be responsible for the rectangular surface lattice of (110) NdGa03 substrate.
| Original language | English |
|---|---|
| Pages (from-to) | 3317-3322 |
| Number of pages | 6 |
| Journal | Japanese Journal of Applied Physics |
| Volume | 31 |
| Issue number | 10 R |
| DOIs | |
| Publication status | Published - Oct 1992 |
| Externally published | Yes |
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All Science Journal Classification (ASJC) codes
- Engineering(all)
- Physics and Astronomy(all)
Cite this
Growth and crystallographic analysis of ybaicuso* Thin films on ndgac>3 substrates. / Mukaida, Masashi; Miyazawa, Shintaro.
In: Japanese Journal of Applied Physics, Vol. 31, No. 10 R, 10.1992, p. 3317-3322.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Growth and crystallographic analysis of ybaicuso* Thin films on ndgac>3 substrates
AU - Mukaida, Masashi
AU - Miyazawa, Shintaro
PY - 1992/10
Y1 - 1992/10
N2 - The growth and crystallographic analysis of tf-axis-oriented YBa2Cu3Ox (abbreviated to YBCO) grains in c-axis- oriented films on NdGa03 substrates is described, a-axis-oriented grains grow at high substrate temperatures and high oxygen pressures.Reflection high energy electron diffraction (RHEED) patterns and 0-scan (in-plane rotation) X-ray measurements reveal that the grains exhibit a twofold symmetry indicating independent b- and c-axis orientations in the surface plane.The in-plane orientation of ^-axis-oriented grains is thought to be responsible for the rectangular surface lattice of (110) NdGa03 substrate.
AB - The growth and crystallographic analysis of tf-axis-oriented YBa2Cu3Ox (abbreviated to YBCO) grains in c-axis- oriented films on NdGa03 substrates is described, a-axis-oriented grains grow at high substrate temperatures and high oxygen pressures.Reflection high energy electron diffraction (RHEED) patterns and 0-scan (in-plane rotation) X-ray measurements reveal that the grains exhibit a twofold symmetry indicating independent b- and c-axis orientations in the surface plane.The in-plane orientation of ^-axis-oriented grains is thought to be responsible for the rectangular surface lattice of (110) NdGa03 substrate.
UR - http://www.scopus.com/inward/record.url?scp=0026929758&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0026929758&partnerID=8YFLogxK
U2 - 10.1143/JJAP.31.3317
DO - 10.1143/JJAP.31.3317
M3 - Article
AN - SCOPUS:0026929758
VL - 31
SP - 3317
EP - 3322
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 10 R
ER -