Abstract
The growth and crystallographic analysis of tf-axis-oriented YBa2Cu3Ox (abbreviated to YBCO) grains in c-axis- oriented films on NdGa03 substrates is described, a-axis-oriented grains grow at high substrate temperatures and high oxygen pressures.Reflection high energy electron diffraction (RHEED) patterns and 0-scan (in-plane rotation) X-ray measurements reveal that the grains exhibit a twofold symmetry indicating independent b- and c-axis orientations in the surface plane.The in-plane orientation of ^-axis-oriented grains is thought to be responsible for the rectangular surface lattice of (110) NdGa03 substrate.
| Original language | English |
|---|---|
| Pages (from-to) | 3317-3322 |
| Number of pages | 6 |
| Journal | Japanese Journal of Applied Physics |
| Volume | 31 |
| Issue number | 10 R |
| DOIs | |
| Publication status | Published - Oct 1992 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Engineering(all)
- Physics and Astronomy(all)
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Mukaida, M., & Miyazawa, S. (1992). Growth and crystallographic analysis of ybaicuso* Thin films on ndgac>3 substrates. Japanese Journal of Applied Physics, 31(10 R), 3317-3322. https://doi.org/10.1143/JJAP.31.3317