Growth atmosphere dependence of transport properties of NiO epitaxial thin films

Keisuke Oka, Takeshi Yanagida, Kazuki Nagashima, Hidekazu Tanaka, Tomoji Kawai

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23 Citations (Scopus)

Abstract

Recent possible applications in nonvolatile resistive switching memory devices renewed the interests in the transport properties of NiO. The variation on the conductivities of NiO films was reported to strongly affect the resistive switching phenomena. The conduction mechanism of NiO has been interpreted in terms of the bulk p -type conduction mechanism via Ni deficiencies (Ni1-δ O). Here we investigate the growth atmosphere dependence on the transport properties of NiO thin films epitaxially grown on MgO (001) substrate. The conductivities of NiO thin films showed completely an opposite tendency compared to the bulk p -type conduction mechanism. Microstructural analysis demonstrates that the conductivity of low temperature grown NiO thin films strongly correlates with tailing the band edge via the deterioration of entire film crystallinity rather than the grain boundaries including second phases.

Original languageEnglish
Article number013711
JournalJournal of Applied Physics
Volume104
Issue number1
DOIs
Publication statusPublished - Jul 28 2008
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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