GRT at the SBST 2015 Tool Competition

Lei Ma, Cyrille Artho, Cheng Zhang, Hiroyuki Sato, Masami Hagiya, Yoshinori Tanabe, Mitsuharu Yamamoto

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Abstract

GRT (Guided Random Testing) is an automatic test generation tool for Java code, which leverages static and dynamic program analysis to guide run-time test generation. In this paper, we summarize competition results and experiences of GRT in participating in SBST 2015, where GRT ranked first with a score of 203.73 points over 63 Java classes from 10 packages of 9 open-source software projects.

Original languageEnglish
Title of host publicationProceedings - 8th International Workshop on Search-Based Software Testing, SBST 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages48-51
Number of pages4
ISBN (Electronic)9781479919345
DOIs
Publication statusPublished - Jul 30 2015
Externally publishedYes
Event8th International Workshop on Search-Based Software Testing, SBST 2015 - Florence, Italy
Duration: May 18 2015May 19 2015

Publication series

NameProceedings - 8th International Workshop on Search-Based Software Testing, SBST 2015

Conference

Conference8th International Workshop on Search-Based Software Testing, SBST 2015
CountryItaly
CityFlorence
Period5/18/155/19/15

Fingerprint

Testing
Open source software

All Science Journal Classification (ASJC) codes

  • Software

Cite this

Ma, L., Artho, C., Zhang, C., Sato, H., Hagiya, M., Tanabe, Y., & Yamamoto, M. (2015). GRT at the SBST 2015 Tool Competition. In Proceedings - 8th International Workshop on Search-Based Software Testing, SBST 2015 (pp. 48-51). [7173592] (Proceedings - 8th International Workshop on Search-Based Software Testing, SBST 2015). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SBST.2015.19

GRT at the SBST 2015 Tool Competition. / Ma, Lei; Artho, Cyrille; Zhang, Cheng; Sato, Hiroyuki; Hagiya, Masami; Tanabe, Yoshinori; Yamamoto, Mitsuharu.

Proceedings - 8th International Workshop on Search-Based Software Testing, SBST 2015. Institute of Electrical and Electronics Engineers Inc., 2015. p. 48-51 7173592 (Proceedings - 8th International Workshop on Search-Based Software Testing, SBST 2015).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ma, L, Artho, C, Zhang, C, Sato, H, Hagiya, M, Tanabe, Y & Yamamoto, M 2015, GRT at the SBST 2015 Tool Competition. in Proceedings - 8th International Workshop on Search-Based Software Testing, SBST 2015., 7173592, Proceedings - 8th International Workshop on Search-Based Software Testing, SBST 2015, Institute of Electrical and Electronics Engineers Inc., pp. 48-51, 8th International Workshop on Search-Based Software Testing, SBST 2015, Florence, Italy, 5/18/15. https://doi.org/10.1109/SBST.2015.19
Ma L, Artho C, Zhang C, Sato H, Hagiya M, Tanabe Y et al. GRT at the SBST 2015 Tool Competition. In Proceedings - 8th International Workshop on Search-Based Software Testing, SBST 2015. Institute of Electrical and Electronics Engineers Inc. 2015. p. 48-51. 7173592. (Proceedings - 8th International Workshop on Search-Based Software Testing, SBST 2015). https://doi.org/10.1109/SBST.2015.19
Ma, Lei ; Artho, Cyrille ; Zhang, Cheng ; Sato, Hiroyuki ; Hagiya, Masami ; Tanabe, Yoshinori ; Yamamoto, Mitsuharu. / GRT at the SBST 2015 Tool Competition. Proceedings - 8th International Workshop on Search-Based Software Testing, SBST 2015. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 48-51 (Proceedings - 8th International Workshop on Search-Based Software Testing, SBST 2015).
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