Hardware-in-the-Loop Simulation on Fault Current Limiting Operation of RE-123 Coated Conductors under the Influence of Spatial Inhomogeneity

Kohei Higashikawa, Masahiro Tajima, Shogo Urasaki, Masayoshi Inoue, Yusuke Fukumoto, Masaru Tomita, Takanobu Kiss

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Hardware-in-the-Loop Simulation on Fault Current Limiting Operation of RE-123 Coated Conductors under the Influence of Spatial Inhomogeneity'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy

Chemical Compounds