Heavy ion beam probe diagnostic system on JFT-2M

T. Ido, Y. Hamada, A. Nishizawa, Y. Kawasumi, Y. Miura, K. Kamiya

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22 Citations (Scopus)

Abstract

Heavy ion beam probe (HIBP) on JFT-2M has been installed. The diagnostic system is described briefly alone with a detailed description of planned calibration experiments. Two sets of poloidal and toroidal sweepers are used, one set at the entrance port and the other set at the exit port. These are used to measure a potential profile from the edge to the core of the plasma and to reduce the error due to the change of the angle to the energy analyzer. The calibration of the required voltages on electrodes of these sweepers for the potential profile measurement will be performed by the ionization of the injected beams with the neutral gas puffed into the tokamak chamber, with special emphasis on the effects of peculiar behaviors of the double sample volumes and sample volume divergence. It is found that in JFT-2M HIBP these phenomena do not disturb the calibration of the potential measurement. These peculiar behaviors will be useful for accurately determining the location of the observation point.

Original languageEnglish
Pages (from-to)955-958
Number of pages4
JournalReview of Scientific Instruments
Volume70
Issue number1 II
Publication statusPublished - Jan 1 1999
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Instrumentation

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    Ido, T., Hamada, Y., Nishizawa, A., Kawasumi, Y., Miura, Y., & Kamiya, K. (1999). Heavy ion beam probe diagnostic system on JFT-2M. Review of Scientific Instruments, 70(1 II), 955-958.