Heavy ion beam probe measurement in turbulence diagnostic simulator

Naohiro Kasuya, Seiya Nishimura, Masatoshi Yagi, Kimitaka Itoh, Sanae I. Itoh

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

A numerical measurement module simulating a heavy ion beam probe was developed, and numerical measurements of electrostatic potential and density fluctuations are carried out for 3-D turbulent data generated by a global simulation of drift-interchange mode turbulence in helical plasmas. The deviation between measured and local values is estimated. It is found that the characteristic structures can be detected in spite of the screening effect due to the finite spatial resolution.

Original languageEnglish
Pages (from-to)326-331
Number of pages6
JournalPlasma Science and Technology
Volume13
Issue number3
DOIs
Publication statusPublished - Jun 1 2011

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simulators
heavy ions
turbulence
ion beams
probes
screening
modules
spatial resolution
electrostatics
deviation
simulation

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

Cite this

Heavy ion beam probe measurement in turbulence diagnostic simulator. / Kasuya, Naohiro; Nishimura, Seiya; Yagi, Masatoshi; Itoh, Kimitaka; Itoh, Sanae I.

In: Plasma Science and Technology, Vol. 13, No. 3, 01.06.2011, p. 326-331.

Research output: Contribution to journalArticle

Kasuya, Naohiro ; Nishimura, Seiya ; Yagi, Masatoshi ; Itoh, Kimitaka ; Itoh, Sanae I. / Heavy ion beam probe measurement in turbulence diagnostic simulator. In: Plasma Science and Technology. 2011 ; Vol. 13, No. 3. pp. 326-331.
@article{0b796d398cf548b5b05d5060ceb622d9,
title = "Heavy ion beam probe measurement in turbulence diagnostic simulator",
abstract = "A numerical measurement module simulating a heavy ion beam probe was developed, and numerical measurements of electrostatic potential and density fluctuations are carried out for 3-D turbulent data generated by a global simulation of drift-interchange mode turbulence in helical plasmas. The deviation between measured and local values is estimated. It is found that the characteristic structures can be detected in spite of the screening effect due to the finite spatial resolution.",
author = "Naohiro Kasuya and Seiya Nishimura and Masatoshi Yagi and Kimitaka Itoh and Itoh, {Sanae I.}",
year = "2011",
month = "6",
day = "1",
doi = "10.1088/1009-0630/13/3/11",
language = "English",
volume = "13",
pages = "326--331",
journal = "Plasma Science and Technology",
issn = "1009-0630",
publisher = "IOP Publishing Ltd.",
number = "3",

}

TY - JOUR

T1 - Heavy ion beam probe measurement in turbulence diagnostic simulator

AU - Kasuya, Naohiro

AU - Nishimura, Seiya

AU - Yagi, Masatoshi

AU - Itoh, Kimitaka

AU - Itoh, Sanae I.

PY - 2011/6/1

Y1 - 2011/6/1

N2 - A numerical measurement module simulating a heavy ion beam probe was developed, and numerical measurements of electrostatic potential and density fluctuations are carried out for 3-D turbulent data generated by a global simulation of drift-interchange mode turbulence in helical plasmas. The deviation between measured and local values is estimated. It is found that the characteristic structures can be detected in spite of the screening effect due to the finite spatial resolution.

AB - A numerical measurement module simulating a heavy ion beam probe was developed, and numerical measurements of electrostatic potential and density fluctuations are carried out for 3-D turbulent data generated by a global simulation of drift-interchange mode turbulence in helical plasmas. The deviation between measured and local values is estimated. It is found that the characteristic structures can be detected in spite of the screening effect due to the finite spatial resolution.

UR - http://www.scopus.com/inward/record.url?scp=79959386591&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79959386591&partnerID=8YFLogxK

U2 - 10.1088/1009-0630/13/3/11

DO - 10.1088/1009-0630/13/3/11

M3 - Article

AN - SCOPUS:79959386591

VL - 13

SP - 326

EP - 331

JO - Plasma Science and Technology

JF - Plasma Science and Technology

SN - 1009-0630

IS - 3

ER -