High accuracy analysis method for 3D nanoscale deformation / fracture characteristics inside a material

Mitsuru Nakazawa, Masakazu Kobayashi, Hiroyuki Toda, Yoshimitsu Aoki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

To evaluate internal thorough material characteristics in deformation, we proposed an analysis method which obtains displacement vectors of dispersed particles between deformation from nano-order 3D-CT images. In this paper, we introduce an improved approach to achieve more robust matching and eliminate the need to tune some parameters. To confirm the effectiveness of the improved approach, virtual tensile tests are carried out. Precision is achieved more than 99% at every matching between adjacent load steps.

Original languageEnglish
Title of host publicationProceedings of SICE Annual Conference 2010, SICE 2010 - Final Program and Papers
PublisherSociety of Instrument and Control Engineers (SICE)
Pages577-584
Number of pages8
ISBN (Print)9784907764364
Publication statusPublished - Jan 1 2010

Publication series

NameProceedings of the SICE Annual Conference

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this

Nakazawa, M., Kobayashi, M., Toda, H., & Aoki, Y. (2010). High accuracy analysis method for 3D nanoscale deformation / fracture characteristics inside a material. In Proceedings of SICE Annual Conference 2010, SICE 2010 - Final Program and Papers (pp. 577-584). [5602327] (Proceedings of the SICE Annual Conference). Society of Instrument and Control Engineers (SICE).

High accuracy analysis method for 3D nanoscale deformation / fracture characteristics inside a material. / Nakazawa, Mitsuru; Kobayashi, Masakazu; Toda, Hiroyuki; Aoki, Yoshimitsu.

Proceedings of SICE Annual Conference 2010, SICE 2010 - Final Program and Papers. Society of Instrument and Control Engineers (SICE), 2010. p. 577-584 5602327 (Proceedings of the SICE Annual Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nakazawa, M, Kobayashi, M, Toda, H & Aoki, Y 2010, High accuracy analysis method for 3D nanoscale deformation / fracture characteristics inside a material. in Proceedings of SICE Annual Conference 2010, SICE 2010 - Final Program and Papers., 5602327, Proceedings of the SICE Annual Conference, Society of Instrument and Control Engineers (SICE), pp. 577-584.
Nakazawa M, Kobayashi M, Toda H, Aoki Y. High accuracy analysis method for 3D nanoscale deformation / fracture characteristics inside a material. In Proceedings of SICE Annual Conference 2010, SICE 2010 - Final Program and Papers. Society of Instrument and Control Engineers (SICE). 2010. p. 577-584. 5602327. (Proceedings of the SICE Annual Conference).
Nakazawa, Mitsuru ; Kobayashi, Masakazu ; Toda, Hiroyuki ; Aoki, Yoshimitsu. / High accuracy analysis method for 3D nanoscale deformation / fracture characteristics inside a material. Proceedings of SICE Annual Conference 2010, SICE 2010 - Final Program and Papers. Society of Instrument and Control Engineers (SICE), 2010. pp. 577-584 (Proceedings of the SICE Annual Conference).
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