High-angle annular dark field scanning transmission electron microscopy of the antiphase boundary in a rapidly solidified B2 type TiPd compound

M. Matsuda, T. Hara, E. Okunishi, M. Nishida

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

High-angle annular dark field scanning transmission electron microscopy (HAADF-STEM) with Z-contrast is applied to characterize the antiphase boundary (APB) of the B2 structure in a rapidly solidified TiPd melt-spun compound. The atomic shift associated with the R=(1/2)a0 〈111〉 type displacement vector is directly observed at the boundary. A microstructure modification of the melt-spun compound with the cooling rate during solidification is also described.

Original languageEnglish
Pages (from-to)59-64
Number of pages6
JournalPhilosophical Magazine Letters
Volume87
Issue number1
DOIs
Publication statusPublished - Jan 1 2007
Externally publishedYes

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antiphase boundaries
solidification
cooling
transmission electron microscopy
microstructure
scanning electron microscopy
shift

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

Cite this

High-angle annular dark field scanning transmission electron microscopy of the antiphase boundary in a rapidly solidified B2 type TiPd compound. / Matsuda, M.; Hara, T.; Okunishi, E.; Nishida, M.

In: Philosophical Magazine Letters, Vol. 87, No. 1, 01.01.2007, p. 59-64.

Research output: Contribution to journalArticle

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