High launch switching activity reduction in at-speed scan testing using CTX: A clock-gating-based test relaxation and x-filling scheme

Kohei Miyase, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara, Patrick Girard, Laung Terng Wang, Mohammad Tehranipoor

Research output: Contribution to journal › Article › peer-review

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