High-Q SWCPL for CMOS millimeter-wave technology

D. A.A. Mat, R. K. Pokharel, R. Sapawi, H. Kanaya, K. Yoshida

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

In this paper, slow wave coplanar waveguide transmission line (SWCPL) is proposed on patterned ground shields in 0.18 μm CMOS technology for low-loss passive devices, components and interconnects in millimeter wave region. Patterned grounds act to produce the slow-wave effect and they are usually kept below the metallization plane to reduce dielectric loss of the lossy silicon substrates. The measured attenuation loss and phase constant of the proposed CPW are 0.619dB/mm and 2.574 rad/mm, respectively which result in the Quality factor (Q-factor) to be 18 at 54 GHz.

Original languageEnglish
Pages (from-to)1284-1289
Number of pages6
JournalIEICE Electronics Express
Volume9
Issue number15
DOIs
Publication statusPublished - 2012

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'High-Q SWCPL for CMOS millimeter-wave technology'. Together they form a unique fingerprint.

Cite this