High resolution electron microscopy characterization of (La0.5Sr0.5)2CoC4 thin film cathode materials

F. Yang; Y. Chen; Z. Cai; N. Tsvetkov; M. Burriel; H. Tellez; B. Yildiz; J. A. Kilner; D. B. Williams; D. W. McComb

doi:10.1017/S1431927614011295

High resolution electron microscopy characterization of (La_0.5Sr_0.5)₂CoC₄ thin film cathode materials

F. Yang, Y. Chen, Z. Cai, N. Tsvetkov, M. Burriel, H. Tellez, B. Yildiz, J. A. Kilner, D. B. Williams, D. W. McComb

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	1912-1913
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614011295
Publication status	Published - Aug 1 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014

All Science Journal Classification (ASJC) codes

Instrumentation

Access to Document

10.1017/S1431927614011295

Cite this

@article{73926c2e11f04e7b86ebadb9fe487ea5,

title = "High resolution electron microscopy characterization of (La0.5Sr0.5)2CoC4 thin film cathode materials",

author = "F. Yang and Y. Chen and Z. Cai and N. Tsvetkov and M. Burriel and H. Tellez and B. Yildiz and Kilner, {J. A.} and Williams, {D. B.} and McComb, {D. W.}",

year = "2014",

month = aug,

day = "1",

doi = "10.1017/S1431927614011295",

language = "English",

volume = "20",

pages = "1912--1913",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "3",

note = "Microscopy and Microanalysis 2014, M and M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

}

TY - JOUR

T1 - High resolution electron microscopy characterization of (La0.5Sr0.5)2CoC4 thin film cathode materials

AU - Yang, F.

AU - Chen, Y.

AU - Cai, Z.

AU - Tsvetkov, N.

AU - Burriel, M.

AU - Tellez, H.

AU - Yildiz, B.

AU - Kilner, J. A.

AU - Williams, D. B.

AU - McComb, D. W.

PY - 2014/8/1

Y1 - 2014/8/1

UR - http://www.scopus.com/inward/record.url?scp=84927937102&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84927937102&partnerID=8YFLogxK

U2 - 10.1017/S1431927614011295

DO - 10.1017/S1431927614011295

M3 - Conference article

SN - 1431-9276

VL - 20

SP - 1912

EP - 1913

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

High resolution electron microscopy characterization of (La0.5Sr0.5)2CoC4 thin film cathode materials

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Cite this

High resolution electron microscopy characterization of (La_0.5Sr_0.5)₂CoC₄ thin film cathode materials