High Resolution Imaging Techniques for Understanding of Mesoscopic Phenomena

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

Transmission electron microscopy (TEM) is a particularly useful tool for studies of mesoscopic phenomena in multifunctional materials. Widely used in experiments in physics, chemistry, biology and materials science, TEM provides various methods for achieving real-space imaging of structures over a wide range of length scales, from atomic columns to macroscopic domain structures. In addition, using the interference of electron waves enables us to carry out high-resolution magnetic imaging, such as direct observation of magnetic flux lines in a thin-foil specimen and determination of important magnetic parameters (e.g., magnetocrystalline anisotropy constant) from a nanometer-scale area. In this chapter, we explain the essence of several methods related to electron microscopy, including energy-filtered electron diffraction, high-resolution TEM (methods for lattice imaging), the classical dark-field method, Lorentz microscopy, and electron holography. These methods provide essential information for a deeper understanding of mesoscopic structures produced in crystalline solids, and the mechanisms underlying material functionalities induced by the mesoscopic phenomena.

Original languageEnglish
Title of host publicationMesoscopic Phenomena in Multifunctional Materials: Synthesis, Characterizatio, Modeling and Applications
PublisherSpringer Verlag
Pages109-135
Number of pages27
Volume198
ISBN (Print)9783642553745
DOIs
Publication statusPublished - 2014
Externally publishedYes

Publication series

NameSpringer Series in Materials Science
Volume198
ISSN (Print)0933033X

Fingerprint

Imaging techniques
Electron holography
Transmission electron microscopy
Magnetocrystalline anisotropy
Magnetic flux
Materials science
High resolution transmission electron microscopy
Electron diffraction
Metal foil
Electron microscopy
Microscopic examination
Physics
Crystalline materials
Electrons
Experiments

All Science Journal Classification (ASJC) codes

  • Materials Science(all)

Cite this

Murakami, Y. (2014). High Resolution Imaging Techniques for Understanding of Mesoscopic Phenomena. In Mesoscopic Phenomena in Multifunctional Materials: Synthesis, Characterizatio, Modeling and Applications (Vol. 198, pp. 109-135). (Springer Series in Materials Science; Vol. 198). Springer Verlag. https://doi.org/10.1007/978-3-642-55375-2_5

High Resolution Imaging Techniques for Understanding of Mesoscopic Phenomena. / Murakami, Yasukazu.

Mesoscopic Phenomena in Multifunctional Materials: Synthesis, Characterizatio, Modeling and Applications. Vol. 198 Springer Verlag, 2014. p. 109-135 (Springer Series in Materials Science; Vol. 198).

Research output: Chapter in Book/Report/Conference proceedingChapter

Murakami, Y 2014, High Resolution Imaging Techniques for Understanding of Mesoscopic Phenomena. in Mesoscopic Phenomena in Multifunctional Materials: Synthesis, Characterizatio, Modeling and Applications. vol. 198, Springer Series in Materials Science, vol. 198, Springer Verlag, pp. 109-135. https://doi.org/10.1007/978-3-642-55375-2_5
Murakami Y. High Resolution Imaging Techniques for Understanding of Mesoscopic Phenomena. In Mesoscopic Phenomena in Multifunctional Materials: Synthesis, Characterizatio, Modeling and Applications. Vol. 198. Springer Verlag. 2014. p. 109-135. (Springer Series in Materials Science). https://doi.org/10.1007/978-3-642-55375-2_5
Murakami, Yasukazu. / High Resolution Imaging Techniques for Understanding of Mesoscopic Phenomena. Mesoscopic Phenomena in Multifunctional Materials: Synthesis, Characterizatio, Modeling and Applications. Vol. 198 Springer Verlag, 2014. pp. 109-135 (Springer Series in Materials Science).
@inbook{78ebde7a584846b6a0641122229ebdf4,
title = "High Resolution Imaging Techniques for Understanding of Mesoscopic Phenomena",
abstract = "Transmission electron microscopy (TEM) is a particularly useful tool for studies of mesoscopic phenomena in multifunctional materials. Widely used in experiments in physics, chemistry, biology and materials science, TEM provides various methods for achieving real-space imaging of structures over a wide range of length scales, from atomic columns to macroscopic domain structures. In addition, using the interference of electron waves enables us to carry out high-resolution magnetic imaging, such as direct observation of magnetic flux lines in a thin-foil specimen and determination of important magnetic parameters (e.g., magnetocrystalline anisotropy constant) from a nanometer-scale area. In this chapter, we explain the essence of several methods related to electron microscopy, including energy-filtered electron diffraction, high-resolution TEM (methods for lattice imaging), the classical dark-field method, Lorentz microscopy, and electron holography. These methods provide essential information for a deeper understanding of mesoscopic structures produced in crystalline solids, and the mechanisms underlying material functionalities induced by the mesoscopic phenomena.",
author = "Yasukazu Murakami",
year = "2014",
doi = "10.1007/978-3-642-55375-2_5",
language = "English",
isbn = "9783642553745",
volume = "198",
series = "Springer Series in Materials Science",
publisher = "Springer Verlag",
pages = "109--135",
booktitle = "Mesoscopic Phenomena in Multifunctional Materials: Synthesis, Characterizatio, Modeling and Applications",
address = "Germany",

}

TY - CHAP

T1 - High Resolution Imaging Techniques for Understanding of Mesoscopic Phenomena

AU - Murakami, Yasukazu

PY - 2014

Y1 - 2014

N2 - Transmission electron microscopy (TEM) is a particularly useful tool for studies of mesoscopic phenomena in multifunctional materials. Widely used in experiments in physics, chemistry, biology and materials science, TEM provides various methods for achieving real-space imaging of structures over a wide range of length scales, from atomic columns to macroscopic domain structures. In addition, using the interference of electron waves enables us to carry out high-resolution magnetic imaging, such as direct observation of magnetic flux lines in a thin-foil specimen and determination of important magnetic parameters (e.g., magnetocrystalline anisotropy constant) from a nanometer-scale area. In this chapter, we explain the essence of several methods related to electron microscopy, including energy-filtered electron diffraction, high-resolution TEM (methods for lattice imaging), the classical dark-field method, Lorentz microscopy, and electron holography. These methods provide essential information for a deeper understanding of mesoscopic structures produced in crystalline solids, and the mechanisms underlying material functionalities induced by the mesoscopic phenomena.

AB - Transmission electron microscopy (TEM) is a particularly useful tool for studies of mesoscopic phenomena in multifunctional materials. Widely used in experiments in physics, chemistry, biology and materials science, TEM provides various methods for achieving real-space imaging of structures over a wide range of length scales, from atomic columns to macroscopic domain structures. In addition, using the interference of electron waves enables us to carry out high-resolution magnetic imaging, such as direct observation of magnetic flux lines in a thin-foil specimen and determination of important magnetic parameters (e.g., magnetocrystalline anisotropy constant) from a nanometer-scale area. In this chapter, we explain the essence of several methods related to electron microscopy, including energy-filtered electron diffraction, high-resolution TEM (methods for lattice imaging), the classical dark-field method, Lorentz microscopy, and electron holography. These methods provide essential information for a deeper understanding of mesoscopic structures produced in crystalline solids, and the mechanisms underlying material functionalities induced by the mesoscopic phenomena.

UR - http://www.scopus.com/inward/record.url?scp=84904745284&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84904745284&partnerID=8YFLogxK

U2 - 10.1007/978-3-642-55375-2_5

DO - 10.1007/978-3-642-55375-2_5

M3 - Chapter

SN - 9783642553745

VL - 198

T3 - Springer Series in Materials Science

SP - 109

EP - 135

BT - Mesoscopic Phenomena in Multifunctional Materials: Synthesis, Characterizatio, Modeling and Applications

PB - Springer Verlag

ER -