High Resolution TEM Observation of Nanocrystalline Silicon Fabricated by High Pressure Torsion (HPT)

Yuta Fukushima, Kaveh Edalati, Yoshifumi Ikoma, Zenji Horita, David J. Smith

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)1783-1784
JournalMicroscopy and Microanalysis
Volume21 (Suppl 3)
Publication statusPublished - Sep 2015

Cite this

High Resolution TEM Observation of Nanocrystalline Silicon Fabricated by High Pressure Torsion (HPT). / Fukushima, Yuta; Edalati, Kaveh; Ikoma, Yoshifumi; Horita, Zenji; Smith, David J.

In: Microscopy and Microanalysis, Vol. 21 (Suppl 3), 09.2015, p. 1783-1784.

Research output: Contribution to journalArticle

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