Abstract
A highly sensitive magnetoresistance behavior related to the well defined induced uniaxial anisotropy has been observed in a single spin valve deposited with a conventional electron beam evaporation. An external magnetic field of 20 Oe (deposition field) was applied during the deposition to induce the anisotropy, which resulted in a marked increase of the MR ratio. Magnetoresistence changes of 4.1 % (improved from 3.1 % due to the application of the deposition field) for NiFe/Cu/Co and 6.3 % for NiFe/Co/Cu/Co were obtained in a micro strip pattern prepared by an Ar ion milling through photoresist mask. A hysteresis free linear MR behavior has been realized in the patterned samples.
Original language | English |
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Pages (from-to) | 4612-4614 |
Number of pages | 3 |
Journal | IEEE Transactions on Magnetics |
Volume | 32 |
Issue number | 5 PART 2 |
DOIs | |
Publication status | Published - Dec 1 1996 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering