Holonomic Approach for Item Response Theory Parameter Estimation

Kazuhisa Noguchi, Eisuke Ito

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The IRT (item response theory) is a theory for scoring of tests, and it is used for some test systems such as TOEFL. Classical test scoring is the total of raw scores for each items (questions). On the other hand, IRT can make fine performance finer than the raw score method. IRT is based on the relationship between individual test takers' performances on a test item (question), and the test takers' levels of performance. Even with the same number of correct answers, the IRT score may be different depending on the degree of difficulty of item (question). Computational complexity of parameter estimation of IRT is one of important issue. To solve this issue, we propose a parameter estimation method of IRT using the Holonomic approach. Generate differential equations which solve the likelihood function of IRT. By solving this differential equation, it is able to estimate the ability parameter.

Original languageEnglish
Title of host publicationProceedings - 2018 7th International Congress on Advanced Applied Informatics, IIAI-AAI 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages322-325
Number of pages4
ISBN (Electronic)9781538674475
DOIs
Publication statusPublished - Jul 2 2018
Event7th International Congress on Advanced Applied Informatics, IIAI-AAI 2018 - Yonago, Japan
Duration: Jul 8 2018Jul 13 2018

Publication series

NameProceedings - 2018 7th International Congress on Advanced Applied Informatics, IIAI-AAI 2018

Conference

Conference7th International Congress on Advanced Applied Informatics, IIAI-AAI 2018
CountryJapan
CityYonago
Period7/8/187/13/18

Fingerprint

Parameter estimation
Differential equations
Computational complexity
performance
Item response theory
ability

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Communication
  • Information Systems
  • Information Systems and Management
  • Education

Cite this

Noguchi, K., & Ito, E. (2018). Holonomic Approach for Item Response Theory Parameter Estimation. In Proceedings - 2018 7th International Congress on Advanced Applied Informatics, IIAI-AAI 2018 (pp. 322-325). [8693276] (Proceedings - 2018 7th International Congress on Advanced Applied Informatics, IIAI-AAI 2018). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IIAI-AAI.2018.00068

Holonomic Approach for Item Response Theory Parameter Estimation. / Noguchi, Kazuhisa; Ito, Eisuke.

Proceedings - 2018 7th International Congress on Advanced Applied Informatics, IIAI-AAI 2018. Institute of Electrical and Electronics Engineers Inc., 2018. p. 322-325 8693276 (Proceedings - 2018 7th International Congress on Advanced Applied Informatics, IIAI-AAI 2018).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Noguchi, K & Ito, E 2018, Holonomic Approach for Item Response Theory Parameter Estimation. in Proceedings - 2018 7th International Congress on Advanced Applied Informatics, IIAI-AAI 2018., 8693276, Proceedings - 2018 7th International Congress on Advanced Applied Informatics, IIAI-AAI 2018, Institute of Electrical and Electronics Engineers Inc., pp. 322-325, 7th International Congress on Advanced Applied Informatics, IIAI-AAI 2018, Yonago, Japan, 7/8/18. https://doi.org/10.1109/IIAI-AAI.2018.00068
Noguchi K, Ito E. Holonomic Approach for Item Response Theory Parameter Estimation. In Proceedings - 2018 7th International Congress on Advanced Applied Informatics, IIAI-AAI 2018. Institute of Electrical and Electronics Engineers Inc. 2018. p. 322-325. 8693276. (Proceedings - 2018 7th International Congress on Advanced Applied Informatics, IIAI-AAI 2018). https://doi.org/10.1109/IIAI-AAI.2018.00068
Noguchi, Kazuhisa ; Ito, Eisuke. / Holonomic Approach for Item Response Theory Parameter Estimation. Proceedings - 2018 7th International Congress on Advanced Applied Informatics, IIAI-AAI 2018. Institute of Electrical and Electronics Engineers Inc., 2018. pp. 322-325 (Proceedings - 2018 7th International Congress on Advanced Applied Informatics, IIAI-AAI 2018).
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