HVEM study of crack tip dislocations in silicon crystals

Kenji Higashida, Masaki Tanaka, Ryuta Onodera

Research output: Contribution to journalConference article

2 Citations (Scopus)

Abstract

The present paper describes the nature of crack tip plasticity in silicon crystals examined by high voltage electron microscopy (HVEM) and atomic force microscopy (AFM). Firstly, AFM images around a crack tip are presented, where the formation of fine slip bands with the step heights of one or two nanometers is demonstrated. Secondly, crack-tip dislocations observed by HVEM are exhibited, where it is emphasized that dislocation characterization is essential to consider the relief mechanism of crack-tip stress concentration.

Original languageEnglish
Pages (from-to)4043-4046
Number of pages4
JournalMaterials Science Forum
Volume475-479
Issue numberV
DOIs
Publication statusPublished - Jan 1 2005
EventPRICM 5: The Fifth Pacific Rim International Conference on Advanced Materials and Processing - Beijing, China
Duration: Nov 2 2004Nov 5 2004

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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