HVEM study of crack tip dislocations in silicon crystals

Kenji Higashida, Masaki Tanaka, Ryuta Onodera

    Research output: Contribution to journalConference articlepeer-review

    2 Citations (Scopus)

    Abstract

    The present paper describes the nature of crack tip plasticity in silicon crystals examined by high voltage electron microscopy (HVEM) and atomic force microscopy (AFM). Firstly, AFM images around a crack tip are presented, where the formation of fine slip bands with the step heights of one or two nanometers is demonstrated. Secondly, crack-tip dislocations observed by HVEM are exhibited, where it is emphasized that dislocation characterization is essential to consider the relief mechanism of crack-tip stress concentration.

    Original languageEnglish
    Pages (from-to)4043-4046
    Number of pages4
    JournalMaterials Science Forum
    Volume475-479
    Issue numberV
    DOIs
    Publication statusPublished - Jan 1 2005
    EventPRICM 5: The Fifth Pacific Rim International Conference on Advanced Materials and Processing - Beijing, China
    Duration: Nov 2 2004Nov 5 2004

    All Science Journal Classification (ASJC) codes

    • Materials Science(all)
    • Condensed Matter Physics
    • Mechanics of Materials
    • Mechanical Engineering

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