Identification of DC corona generating SF6 decomposition gases adsorbed on CNT gas sensor using FTIR spectroscopy

Yul Martin, Zhenyu Li, Takuya Tsutsumi, Junya Suehiro, Kiminobu Imasaka, Shinya Ohtsuka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

It is important to detect decomposition of insulating gas SF6 caused by partial discharges for gas-insulated switchgear (GIS). In the previous result, the author developed a novel partial discharges sensing using carbon nanotube (CNT) gas sensor. In recently, an application of high voltage DC for long distance electric power transmission has been often used in various countries as the interconnection system and overload demand. In this study we applied the CNT gas sensor to detect partial discharges generated by high voltage DC. There was polarity profile for DC compared AC discharges. It was found, response of the sensor in the case of negative discharges was much higher than positive discharges under the same experimental condition. And the decomposed gases for each case were identified by FT-IR spectroscopy. The result indicated absorption peaks correspond to SF4 and SOF2 of positive discharges was much higher than that of negative discharges.

Original languageEnglish
Title of host publicationTENCON 2010 - 2010 IEEE Region 10 Conference
Pages663-666
Number of pages4
DOIs
Publication statusPublished - Dec 1 2010
Event2010 IEEE Region 10 Conference, TENCON 2010 - Fukuoka, Japan
Duration: Nov 21 2010Nov 24 2010

Publication series

NameIEEE Region 10 Annual International Conference, Proceedings/TENCON

Other

Other2010 IEEE Region 10 Conference, TENCON 2010
CountryJapan
CityFukuoka
Period11/21/1011/24/10

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Electrical and Electronic Engineering

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    Martin, Y., Li, Z., Tsutsumi, T., Suehiro, J., Imasaka, K., & Ohtsuka, S. (2010). Identification of DC corona generating SF6 decomposition gases adsorbed on CNT gas sensor using FTIR spectroscopy. In TENCON 2010 - 2010 IEEE Region 10 Conference (pp. 663-666). [5686640] (IEEE Region 10 Annual International Conference, Proceedings/TENCON). https://doi.org/10.1109/TENCON.2010.5686640