Identification of device degradation positions in multi-layered phosphorescent organic light emitting devices using water probes

Hitoshi Yamamoto, Chihaya Adachi, Michael S. Weaver, Julie J. Brown

Research output: Contribution to journalArticle

22 Citations (Scopus)

Abstract

We exposed regions of green phosphorescent organic light emitting devices (PHOLED TMs) consisting of a fac-tris(2-phenylpyridine)iridium (Ir(ppy) 3) as the phosphorescent emitter to a partial pressure of water of 3 × 10 -4 Pa during device fabrication to induce degradation in a specific region of the multi-layered devices. We identified the interface between the hole transport layer and the emissive layer as the most susceptive region to degradation. We discuss the luminance loss mechanism and estimate an operational lifetime of 10 000 h, after 20 loss of the initial luminance from 1000 cd/m 2, is attainable from an Ir(ppy) 3 PHOLED fabricated under ultra-high vacuum conditions.

Original languageEnglish
Article number183306
JournalApplied Physics Letters
Volume100
Issue number18
DOIs
Publication statusPublished - Apr 30 2012

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degradation
luminance
probes
water
iridium
ultrahigh vacuum
partial pressure
emitters
life (durability)
fabrication
estimates

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Identification of device degradation positions in multi-layered phosphorescent organic light emitting devices using water probes. / Yamamoto, Hitoshi; Adachi, Chihaya; Weaver, Michael S.; Brown, Julie J.

In: Applied Physics Letters, Vol. 100, No. 18, 183306, 30.04.2012.

Research output: Contribution to journalArticle

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