Identification of device degradation positions in multi-layered phosphorescent organic light emitting devices using water probes

Hitoshi Yamamoto; Chihaya Adachi; Michael S. Weaver; Julie J. Brown

doi:10.1063/1.4711129

Identification of device degradation positions in multi-layered phosphorescent organic light emitting devices using water probes

Hitoshi Yamamoto, Chihaya Adachi, Michael S. Weaver, Julie J. Brown

Applied Chemistry

Research output: Contribution to journal › Article › peer-review

24 Citations (Scopus)

Abstract

We exposed regions of green phosphorescent organic light emitting devices (PHOLED ^TMs) consisting of a fac-tris(2-phenylpyridine)iridium (Ir(ppy) ₃) as the phosphorescent emitter to a partial pressure of water of 3 × 10 ^-4 Pa during device fabrication to induce degradation in a specific region of the multi-layered devices. We identified the interface between the hole transport layer and the emissive layer as the most susceptive region to degradation. We discuss the luminance loss mechanism and estimate an operational lifetime of 10 000 h, after 20 loss of the initial luminance from 1000 cd/m ², is attainable from an Ir(ppy) ₃ PHOLED fabricated under ultra-high vacuum conditions.

Original language	English
Article number	183306
Journal	Applied Physics Letters
Volume	100
Issue number	18
DOIs	https://doi.org/10.1063/1.4711129
Publication status	Published - Apr 30 2012

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

Access to Document

10.1063/1.4711129

Fingerprint Dive into the research topics of 'Identification of device degradation positions in multi-layered phosphorescent organic light emitting devices using water probes'. Together they form a unique fingerprint.

Cite this

@article{ba73442846c84fbba7b1b9db2fe8c0f8,

title = "Identification of device degradation positions in multi-layered phosphorescent organic light emitting devices using water probes",

abstract = "We exposed regions of green phosphorescent organic light emitting devices (PHOLED TMs) consisting of a fac-tris(2-phenylpyridine)iridium (Ir(ppy) 3) as the phosphorescent emitter to a partial pressure of water of 3 × 10 -4 Pa during device fabrication to induce degradation in a specific region of the multi-layered devices. We identified the interface between the hole transport layer and the emissive layer as the most susceptive region to degradation. We discuss the luminance loss mechanism and estimate an operational lifetime of 10 000 h, after 20 loss of the initial luminance from 1000 cd/m 2, is attainable from an Ir(ppy) 3 PHOLED fabricated under ultra-high vacuum conditions.",

author = "Hitoshi Yamamoto and Chihaya Adachi and Weaver, {Michael S.} and Brown, {Julie J.}",

year = "2012",

month = apr,

day = "30",

doi = "10.1063/1.4711129",

language = "English",

volume = "100",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "18",

}

TY - JOUR

T1 - Identification of device degradation positions in multi-layered phosphorescent organic light emitting devices using water probes

AU - Yamamoto, Hitoshi

AU - Adachi, Chihaya

AU - Weaver, Michael S.

AU - Brown, Julie J.

PY - 2012/4/30

Y1 - 2012/4/30

N2 - We exposed regions of green phosphorescent organic light emitting devices (PHOLED TMs) consisting of a fac-tris(2-phenylpyridine)iridium (Ir(ppy) 3) as the phosphorescent emitter to a partial pressure of water of 3 × 10 -4 Pa during device fabrication to induce degradation in a specific region of the multi-layered devices. We identified the interface between the hole transport layer and the emissive layer as the most susceptive region to degradation. We discuss the luminance loss mechanism and estimate an operational lifetime of 10 000 h, after 20 loss of the initial luminance from 1000 cd/m 2, is attainable from an Ir(ppy) 3 PHOLED fabricated under ultra-high vacuum conditions.

AB - We exposed regions of green phosphorescent organic light emitting devices (PHOLED TMs) consisting of a fac-tris(2-phenylpyridine)iridium (Ir(ppy) 3) as the phosphorescent emitter to a partial pressure of water of 3 × 10 -4 Pa during device fabrication to induce degradation in a specific region of the multi-layered devices. We identified the interface between the hole transport layer and the emissive layer as the most susceptive region to degradation. We discuss the luminance loss mechanism and estimate an operational lifetime of 10 000 h, after 20 loss of the initial luminance from 1000 cd/m 2, is attainable from an Ir(ppy) 3 PHOLED fabricated under ultra-high vacuum conditions.

UR - http://www.scopus.com/inward/record.url?scp=84862551507&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84862551507&partnerID=8YFLogxK

U2 - 10.1063/1.4711129

DO - 10.1063/1.4711129

M3 - Article

AN - SCOPUS:84862551507

VL - 100

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 18

M1 - 183306

ER -