Identification of native defects around grain boundary in Pr-doped ZnO bicrystal using electron energy loss spectroscopy and first-principles calculations

Yukio Sato, Teruyasu Mizoguchi, Fumiyasu Oba, Masatada Yodogawa, Takahisa Yamamoto, Yuichi Ikuhara

Research output: Contribution to journalArticle

32 Citations (Scopus)

Abstract

Electron energy loss spectroscopy and first-principles calculations were used to analyze the native defects and Pr dopant around grain boundaries in Pr-doped and undoped ZnO bicrystals. It was observed that the Pr-doped bicrystal exhibited a nonlinear current-voltage characteristic, whereas the undoped bicrystal shows an ohmic characteristic. Pr was found to be present within 8 nm around the grain boundary in the Pr-doped bicrystal. The results show that the EELS investigation of native defects combined with first-principles calculations indicate the presence of zinc vacancies in the vicinity of the Pr-doped grain boundary.

Original languageEnglish
Pages (from-to)5311-5313
Number of pages3
JournalApplied Physics Letters
Volume84
Issue number26
DOIs
Publication statusPublished - Jun 28 2004

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bicrystals
grain boundaries
energy dissipation
electron energy
defects
spectroscopy
zinc
electric potential

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Identification of native defects around grain boundary in Pr-doped ZnO bicrystal using electron energy loss spectroscopy and first-principles calculations. / Sato, Yukio; Mizoguchi, Teruyasu; Oba, Fumiyasu; Yodogawa, Masatada; Yamamoto, Takahisa; Ikuhara, Yuichi.

In: Applied Physics Letters, Vol. 84, No. 26, 28.06.2004, p. 5311-5313.

Research output: Contribution to journalArticle

Sato, Yukio ; Mizoguchi, Teruyasu ; Oba, Fumiyasu ; Yodogawa, Masatada ; Yamamoto, Takahisa ; Ikuhara, Yuichi. / Identification of native defects around grain boundary in Pr-doped ZnO bicrystal using electron energy loss spectroscopy and first-principles calculations. In: Applied Physics Letters. 2004 ; Vol. 84, No. 26. pp. 5311-5313.
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