Identification of ultradilute dopants in ceramics

Isao Tanaka; Teruyasu Mizoguchi; Masafumi Matsui; Satoru Yoshioka; Hirohiko Adachi; Tomoyuki Yamamoto; Toshihiro Okajima; Masanori Umesaki; Wai Yim Ching; Yoshiyuki Inoue; Masataka Mizuno; Hideki Araki; Yasuharu Shirai

doi:10.1038/nmat939

Identification of ultradilute dopants in ceramics

Isao Tanaka, Teruyasu Mizoguchi, Masafumi Matsui, Satoru Yoshioka, Hirohiko Adachi, Tomoyuki Yamamoto, Toshihiro Okajima, Masanori Umesaki, Wai Yim Ching, Yoshiyuki Inoue, Masataka Mizuno, Hideki Araki, Yasuharu Shirai

Research output: Contribution to journal › Article › peer-review

81 Citations (Scopus)

Abstract

The properties of ceramic materials are strongly influenced by the presence of ultradilute impurities (dopants). Near-edge X-ray absorption fine structure (NEXAFS) measurements using third-generation synchotron sources can be used to identify ultradilute dopants, provided that a good theoretical tool is available to interpret the spectra. Here, we use NEXAFS analysis and first-principles calculations to study the local environments of Ga dopants at levels of 10 p.p.m in otherwise high-purity MgO. This analysis suggests that the extra charge associated with substitutional Ga on a Mg site is compensated by the formation of a Mg vacancy. This defect model is then confirmed by positron lifetime measurements and planewave pseudopotential calculations. This powerful combination of techniques should provide a general method of identifying the defect states of ultradilute dopants in ceramics.

Original language	English
Pages (from-to)	541-545
Number of pages	5
Journal	Nature Materials
Volume	2
Issue number	8
DOIs	https://doi.org/10.1038/nmat939
Publication status	Published - Aug 2003
Externally published	Yes

All Science Journal Classification (ASJC) codes

Chemistry(all)
Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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10.1038/nmat939

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title = "Identification of ultradilute dopants in ceramics",

abstract = "The properties of ceramic materials are strongly influenced by the presence of ultradilute impurities (dopants). Near-edge X-ray absorption fine structure (NEXAFS) measurements using third-generation synchotron sources can be used to identify ultradilute dopants, provided that a good theoretical tool is available to interpret the spectra. Here, we use NEXAFS analysis and first-principles calculations to study the local environments of Ga dopants at levels of 10 p.p.m in otherwise high-purity MgO. This analysis suggests that the extra charge associated with substitutional Ga on a Mg site is compensated by the formation of a Mg vacancy. This defect model is then confirmed by positron lifetime measurements and planewave pseudopotential calculations. This powerful combination of techniques should provide a general method of identifying the defect states of ultradilute dopants in ceramics.",

author = "Isao Tanaka and Teruyasu Mizoguchi and Masafumi Matsui and Satoru Yoshioka and Hirohiko Adachi and Tomoyuki Yamamoto and Toshihiro Okajima and Masanori Umesaki and Ching, {Wai Yim} and Yoshiyuki Inoue and Masataka Mizuno and Hideki Araki and Yasuharu Shirai",

note = "Funding Information: Experimental support by T. Uruga, H. Tanida and T. Homma of JASRI/SPring-8 (synchotron radiation facility, Japan), under proposal No. 2002A0342-NX-np and helpful discussion with F. Oba and M.Yoshiya of Kyoto University are gratefully acknowledged. This work was supported by the Grant-in-Aid for Scientific Research on Priority Areas (No.751) and the 21st century COE program , both from the Ministry of Education, Culture, Sports, Science and Technology of Japan, and the international collaboration program from NEDO, Japan.W.Y.C. was supported by the US Department of Energy under grant number DE-FG02-84ER45170. Correspondence and requests for materials should be addressed to I.T.",

year = "2003",

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doi = "10.1038/nmat939",

language = "English",

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T1 - Identification of ultradilute dopants in ceramics

AU - Tanaka, Isao

AU - Mizoguchi, Teruyasu

AU - Matsui, Masafumi

AU - Yoshioka, Satoru

AU - Adachi, Hirohiko

AU - Yamamoto, Tomoyuki

AU - Okajima, Toshihiro

AU - Umesaki, Masanori

AU - Ching, Wai Yim

AU - Inoue, Yoshiyuki

AU - Mizuno, Masataka

AU - Araki, Hideki

AU - Shirai, Yasuharu

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PY - 2003/8

Y1 - 2003/8

N2 - The properties of ceramic materials are strongly influenced by the presence of ultradilute impurities (dopants). Near-edge X-ray absorption fine structure (NEXAFS) measurements using third-generation synchotron sources can be used to identify ultradilute dopants, provided that a good theoretical tool is available to interpret the spectra. Here, we use NEXAFS analysis and first-principles calculations to study the local environments of Ga dopants at levels of 10 p.p.m in otherwise high-purity MgO. This analysis suggests that the extra charge associated with substitutional Ga on a Mg site is compensated by the formation of a Mg vacancy. This defect model is then confirmed by positron lifetime measurements and planewave pseudopotential calculations. This powerful combination of techniques should provide a general method of identifying the defect states of ultradilute dopants in ceramics.

AB - The properties of ceramic materials are strongly influenced by the presence of ultradilute impurities (dopants). Near-edge X-ray absorption fine structure (NEXAFS) measurements using third-generation synchotron sources can be used to identify ultradilute dopants, provided that a good theoretical tool is available to interpret the spectra. Here, we use NEXAFS analysis and first-principles calculations to study the local environments of Ga dopants at levels of 10 p.p.m in otherwise high-purity MgO. This analysis suggests that the extra charge associated with substitutional Ga on a Mg site is compensated by the formation of a Mg vacancy. This defect model is then confirmed by positron lifetime measurements and planewave pseudopotential calculations. This powerful combination of techniques should provide a general method of identifying the defect states of ultradilute dopants in ceramics.

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Identification of ultradilute dopants in ceramics

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