Imaging of charged micropatterned monolayer surfaces by chemical force microscopy

Tomoyuki Koga, Hideyuki Otsuka, Atsushi Takahara

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Chemical force microscopy (CFM) was applied for the lateral force microscopic imaging of micropatterned organosilane monolayer surfaces with oppositely charged phases using chemically modified cantilever tips. Chemically modified cantilever tips with oxidized mercaptosilane, aminosilane, and unmodified cantilever tip were employed as a tip for CFM. Lateral force imaging of the micropatterned surface with opposite charge was successfully achieved by controlling the pH of the aqueous solution in consideration of the electrostatic condition of functional groups on the cantilever tip and substrate surface.

Original languageEnglish
Pages (from-to)1691-1698
Number of pages8
JournalBulletin of the Chemical Society of Japan
Volume78
Issue number9
DOIs
Publication statusPublished - Sep 15 2005

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Monolayers
Microscopic examination
Imaging techniques
Functional groups
Electrostatics
Substrates

All Science Journal Classification (ASJC) codes

  • Chemistry(all)

Cite this

Imaging of charged micropatterned monolayer surfaces by chemical force microscopy. / Koga, Tomoyuki; Otsuka, Hideyuki; Takahara, Atsushi.

In: Bulletin of the Chemical Society of Japan, Vol. 78, No. 9, 15.09.2005, p. 1691-1698.

Research output: Contribution to journalArticle

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