Imaging of local structures affecting electrical transport properties of large graphene sheets by lock-in thermography

H. Nakajima, T. Morimoto, Y. Okigawa, T. Yamada, Y. Ikuta, K. Kawahara, H. Ago, T. Okazaki

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

The distribution of defects and dislocations in graphene layers has become a very important concern with regard to the electrical and electronic transport properties of device applications. Although several experiments have shown the influence of defects on the electrical properties of graphene, these studies were limited to measuring microscopic areas because of their long measurement times. Here, we successfully imaged various local defects in a large area of chemical vapor deposition graphene within a reasonable amount of time by using lock-in thermography (LIT). The differences in electrical resistance caused by the micrometer-scale defects, such as cracks and wrinkles, and atomic-scale domain boundaries were apparent as nonuniform Joule heating on polycrystalline and epitaxially grown graphene. The present results indicate that LIT can serve as a fast and effective method of evaluating the quality and uniformity of large graphene films for device applications.

Original languageEnglish
Article numbereaau3407
JournalScience Advances
Volume5
Issue number2
DOIs
Publication statusPublished - Feb 1 2019

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)
  • General

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    Nakajima, H., Morimoto, T., Okigawa, Y., Yamada, T., Ikuta, Y., Kawahara, K., Ago, H., & Okazaki, T. (2019). Imaging of local structures affecting electrical transport properties of large graphene sheets by lock-in thermography. Science Advances, 5(2), [eaau3407]. https://doi.org/10.1126/sciadv.aau3407