Impact for Radiated Noise by Current Smoothness with Bare SiC MOSFET and Si RC-IGBT Chips

Toshiya Tadakuma, Michael Rogers, Koichi Nishi, Motonobu Joko, Masahito Shoyama

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Power device structures have been improved to shrink area of chip and to reduce power loss. The switching speed has continued increasing to reduce switching loss, and electromagnetic noise also has been increasing and shifting to higher frequency. It is important to reduce generation of noise for establishing proper operation of power converters or inverters for motor control, thus simple switching behavior should be reconsidered anew. This report describes the relationship between switching behavior and intensity of the electric field at an antenna using electromagnetic potential and wavelet transform with switching data measured by extended double pulse test for bare SiC MOSFETs and Si RC-IGBTs.

Original languageEnglish
Title of host publication2021 Joint IEEE International Symposium on Electromagnetic Compatibility Signal and Power Integrity, and EMC Europe, EMC/SI/PI/EMC Europe 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1075-1080
Number of pages6
ISBN (Electronic)9781665448888
DOIs
Publication statusPublished - Jul 26 2021
Event2021 Joint IEEE International Symposium on Electromagnetic Compatibility Signal and Power Integrity, and EMC Europe, EMC/SI/PI/EMC Europe 2021 - Raleigh, United States
Duration: Jul 26 2021Aug 20 2021

Publication series

Name2021 Joint IEEE International Symposium on Electromagnetic Compatibility Signal and Power Integrity, and EMC Europe, EMC/SI/PI/EMC Europe 2021

Conference

Conference2021 Joint IEEE International Symposium on Electromagnetic Compatibility Signal and Power Integrity, and EMC Europe, EMC/SI/PI/EMC Europe 2021
Country/TerritoryUnited States
CityRaleigh
Period7/26/218/20/21

All Science Journal Classification (ASJC) codes

  • Signal Processing
  • Energy Engineering and Power Technology
  • Aerospace Engineering
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Radiation

Fingerprint

Dive into the research topics of 'Impact for Radiated Noise by Current Smoothness with Bare SiC MOSFET and Si RC-IGBT Chips'. Together they form a unique fingerprint.

Cite this