Impact of nuclear reaction models on neutron-induced soft error rate analysis

Shin Ichiro Abe, Ryotaro Ogata, Yukinobu Watanabe

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

Terrestrial neutron-induced soft error rate (SER) analyses in the 25-nm design rule MOSFET are performed by means of multiscale Monte Carlo simulation with different nuclear reaction models used in PHITS code. It is clarified that a choice of nuclear reaction models has a great effect on the SER prediction. Even if the calculated production cross sections for secondary ions are the same among different reaction models, the difference in double-differential cross sections results in essential impact on the calculated SERs. Through validation of the nuclear reaction models used in PHITS code, it is concluded that the combined use of the e-mode with JENDL-4.0 below 20 MeV and the MQMD plus GEM above 20 MeV is the most suitable for the soft error simulation.

Original languageEnglish
Article number6819468
Pages (from-to)1806-1812
Number of pages7
JournalIEEE Transactions on Nuclear Science
Volume61
Issue number4
DOIs
Publication statusPublished - Aug 2014

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

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