Impact of nuclear reaction models on neutron-induced soft error rate analysis

Shin Ichiro Abe; Ryotaro Ogata; Yukinobu Watanabe

doi:10.1109/TNS.2014.2307298

Impact of nuclear reaction models on neutron-induced soft error rate analysis

Shin Ichiro Abe, Ryotaro Ogata, Yukinobu Watanabe

Engineering Science for Advanced energy system

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

Terrestrial neutron-induced soft error rate (SER) analyses in the 25-nm design rule MOSFET are performed by means of multiscale Monte Carlo simulation with different nuclear reaction models used in PHITS code. It is clarified that a choice of nuclear reaction models has a great effect on the SER prediction. Even if the calculated production cross sections for secondary ions are the same among different reaction models, the difference in double-differential cross sections results in essential impact on the calculated SERs. Through validation of the nuclear reaction models used in PHITS code, it is concluded that the combined use of the e-mode with JENDL-4.0 below 20 MeV and the MQMD plus GEM above 20 MeV is the most suitable for the soft error simulation.

Original language	English
Article number	6819468
Pages (from-to)	1806-1812
Number of pages	7
Journal	IEEE Transactions on Nuclear Science
Volume	61
Issue number	4
DOIs	https://doi.org/10.1109/TNS.2014.2307298
Publication status	Published - Aug 2014

All Science Journal Classification (ASJC) codes

Nuclear and High Energy Physics
Nuclear Energy and Engineering
Electrical and Electronic Engineering

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abstract = "Terrestrial neutron-induced soft error rate (SER) analyses in the 25-nm design rule MOSFET are performed by means of multiscale Monte Carlo simulation with different nuclear reaction models used in PHITS code. It is clarified that a choice of nuclear reaction models has a great effect on the SER prediction. Even if the calculated production cross sections for secondary ions are the same among different reaction models, the difference in double-differential cross sections results in essential impact on the calculated SERs. Through validation of the nuclear reaction models used in PHITS code, it is concluded that the combined use of the e-mode with JENDL-4.0 below 20 MeV and the MQMD plus GEM above 20 MeV is the most suitable for the soft error simulation.",

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AU - Abe, Shin Ichiro

AU - Ogata, Ryotaro

AU - Watanabe, Yukinobu

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N2 - Terrestrial neutron-induced soft error rate (SER) analyses in the 25-nm design rule MOSFET are performed by means of multiscale Monte Carlo simulation with different nuclear reaction models used in PHITS code. It is clarified that a choice of nuclear reaction models has a great effect on the SER prediction. Even if the calculated production cross sections for secondary ions are the same among different reaction models, the difference in double-differential cross sections results in essential impact on the calculated SERs. Through validation of the nuclear reaction models used in PHITS code, it is concluded that the combined use of the e-mode with JENDL-4.0 below 20 MeV and the MQMD plus GEM above 20 MeV is the most suitable for the soft error simulation.

AB - Terrestrial neutron-induced soft error rate (SER) analyses in the 25-nm design rule MOSFET are performed by means of multiscale Monte Carlo simulation with different nuclear reaction models used in PHITS code. It is clarified that a choice of nuclear reaction models has a great effect on the SER prediction. Even if the calculated production cross sections for secondary ions are the same among different reaction models, the difference in double-differential cross sections results in essential impact on the calculated SERs. Through validation of the nuclear reaction models used in PHITS code, it is concluded that the combined use of the e-mode with JENDL-4.0 below 20 MeV and the MQMD plus GEM above 20 MeV is the most suitable for the soft error simulation.

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Impact of nuclear reaction models on neutron-induced soft error rate analysis

Abstract

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