Impact of the Angle of Incidence on Negative Muon-Induced SEU Cross Sections of 65-nm Bulk and FDSOI SRAMs

Wang Liao, Masanori Hashimoto, Seiya Manabe, Yukinobu Watanabe, Shin Ichiro Abe, Motonobu Tampo, Soshi Takeshita, Yasuhiro Miyake

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Physics & Astronomy

Engineering & Materials Science