Original language | English |
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Pages (from-to) | 3147-3149 |
Number of pages | 3 |
Journal | Japanese Journal of Applied Physics, Part 2: Letters |
Volume | 45 |
Issue number | 4 |
Publication status | Published - Apr 2006 |
Improved Oxidation-Induced Ge Condensation Technique Using H〔+〕 Implantation and Post Annealing for Highly Stress-Relaxed Ultrathin SiGe on Insulator (Special Issue: Solid State Devices & Materials)
Masanori Tanaka, Isao Tsunoda, Taizoh Sadoh, Toyotsugu Enokida, Masaharu Ninomiya, Masahiko Nakamae, Masanobu Miyao
Research output: Contribution to journal › Article › peer-review