Improvement of a 500 keV heavy-ion-beam probe for JIPP T-IIU tokamak

Y. Hamada, Y. Kawasumi, A. Nishizawa, K. Narihara, K. Sato, T. Seki, K. Toi, H. Iguchi, A. Fujisawa, K. Adachi, A. Ejiri, S. Hidekuma, S. Hirokura, K. Ida, K. Kawahata, M. Kojima, K. Joong, R. Kumazawa, H. Kuramoto, R. LiangT. Minami, H. Sakakita, M. Sasao, K. N. Sato, T. Tsuzuki, J. Xu, I. Yamada, T. Watari

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Abstract

Several improvements in the high-voltage heavy-ion-beam probe (HIBP) are discussed. (1) It is clearly found that the precision slide mount of the detector plates 30° parallel to the base electrode is very effective for the determination of the in-plane entrance angle of the beam in the analyzer to estimate the error in the potential measurement. (2) A two-staged optical trap in the HIBP greatly reduced the effect of the UV radiation in the analyzer. (3) A multiple-plate detector up to 13 measurement points clearly showed the direction of the propagation of the turbulence and path-integral effects.

Original languageEnglish
Pages (from-to)321-323
Number of pages3
JournalReview of Scientific Instruments
Volume66
Issue number1
DOIs
Publication statusPublished - Dec 1 1995
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

Hamada, Y., Kawasumi, Y., Nishizawa, A., Narihara, K., Sato, K., Seki, T., ... Watari, T. (1995). Improvement of a 500 keV heavy-ion-beam probe for JIPP T-IIU tokamak. Review of Scientific Instruments, 66(1), 321-323. https://doi.org/10.1063/1.1146399