Abstract
The appearance of 45° grain boundaries in c-axis oriented YBa2Cu3Ox films grown by pulsed laser deposition on MgO (001) substrates is discussed. X-ray φ-scan (in-plane orientation) measurements have revealed that YBa2Cu3Ox films grown at around 700°C have two types of grains with [100]Mgo ∥ [100]YBCO and [110]MgO ∥ [100]YBCO in-plane epitaxial relationships. A plausible growth model is proposed from the viewpoints of lattice matching and ionic adhesive energy. The ratio of 0° and 45° grains is found to be a function of the substrate temperature. By decreasing the substrate temperature, we obtained c-axis oriented YBa2Cu3Ox thin films with only a [100]Mgo ∥ [100]YBCO in-plane epitaxial relation. We have eliminated the 45° grain boundaries which drastically increase the surface resistance of the YBa2Cu3Ox films for microwave applications.
Original language | English |
---|---|
Pages (from-to) | 1945-1948 |
Number of pages | 4 |
Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
Volume | 38 |
Issue number | 4 A |
Publication status | Published - Dec 1 1999 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Engineering(all)
- Physics and Astronomy(all)