In-plane orientation of C-axis oriented YBa2Cu3Ox films on MgO substrates

Masashi Mukaida, Yoshinobu Takano, Kazuaki Chiba, Masanobu Kusunoki, Shigetoshi Ohshima

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19 Citations (Scopus)

Abstract

The appearance of 45° grain boundaries in c-axis oriented YBa2Cu3Ox films grown by pulsed laser deposition on MgO (001) substrates is discussed. X-ray φ-scan (in-plane orientation) measurements have revealed that YBa2Cu3Ox films grown at around 700°C have two types of grains with [100]Mgo ∥ [100]YBCO and [110]MgO ∥ [100]YBCO in-plane epitaxial relationships. A plausible growth model is proposed from the viewpoints of lattice matching and ionic adhesive energy. The ratio of 0° and 45° grains is found to be a function of the substrate temperature. By decreasing the substrate temperature, we obtained c-axis oriented YBa2Cu3Ox thin films with only a [100]Mgo ∥ [100]YBCO in-plane epitaxial relation. We have eliminated the 45° grain boundaries which drastically increase the surface resistance of the YBa2Cu3Ox films for microwave applications.

Original languageEnglish
Pages (from-to)1945-1948
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume38
Issue number4 A
Publication statusPublished - Dec 1 1999
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

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