In-situ EBSP analysis of grain boundary migration during recrystallization in pure aluminum foils

Naoki Takata, Ken Ichi Ikeda, Hideharu Nakashima, Nobuhiro Tsuji

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Abstract

Grain boundary mobility in preferential growth of cube grains ({100}〈001〉) was evaluated by in-situ electron back scattering diffraction pattern (EBSP) analysis in order to clarify the fundamental mechanism of primary recrystallization in pure aluminum foils of 99.9% purity thermo-mechanically processed in the industrial production route for aluminum foils for electrolytic capacitors. We have carried out the continuous EBSP measurements during recrystallization of the aluminum foils heated to various temperatures in the chamber of scanning electron microscopy (SEM). We have succeeded in dynamic observation of the preferential growth of cube grains by the in-situ EBSP analysis. The in-situ EBSP analysis could reveal the migration rate of grain boundaries surrounding the cube grains. It was clarified that the proportional relation between migration rate and annealing time was satisfied. The stored energy providing the driving force for the grain boundary migration during primary recrystallization could be estimated from the misorientation within the deformed grains. The mobility of the grain boundary could be evaluated using the measured grain boundary migration rate and stored energy. Then the activation energy could be estimated by the in-situ EBSP analysis at various temperatures ranging from 270°C to 310°C. The obtained activation energy was 124 kJ/mol, which approximately corresponded to that for the diffusion of impurity such as iron or silicon in aluminum. This suggested that the rate-determining process of the grain boundary migration of cube grains was impurity diffusion in the pure aluminum foils.

Original languageEnglish
Title of host publicationRecrystallization and Grain Growth III - Proceedings of the Third International Conference on Recrystallization and Grain Growth, ReX and GG III
Pages351-356
Number of pages6
EditionPART 1
Publication statusPublished - Dec 1 2007
Event3rd International Conference on Recrystallization and Grain Growth, ReX GG III - Jeju Island, Korea, Republic of
Duration: Jun 10 2007Jun 15 2007

Publication series

NameMaterials Science Forum
NumberPART 1
Volume558-559
ISSN (Print)0255-5476

Other

Other3rd International Conference on Recrystallization and Grain Growth, ReX GG III
CountryKorea, Republic of
CityJeju Island
Period6/10/076/15/07

Fingerprint

Aluminum foil
Diffraction patterns
Grain boundaries
Scattering
Electrons
Activation energy
Impurities
Electrolytic capacitors
Silicon
Aluminum
Iron
Annealing
Temperature
Scanning electron microscopy

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Takata, N., Ikeda, K. I., Nakashima, H., & Tsuji, N. (2007). In-situ EBSP analysis of grain boundary migration during recrystallization in pure aluminum foils. In Recrystallization and Grain Growth III - Proceedings of the Third International Conference on Recrystallization and Grain Growth, ReX and GG III (PART 1 ed., pp. 351-356). (Materials Science Forum; Vol. 558-559, No. PART 1).

In-situ EBSP analysis of grain boundary migration during recrystallization in pure aluminum foils. / Takata, Naoki; Ikeda, Ken Ichi; Nakashima, Hideharu; Tsuji, Nobuhiro.

Recrystallization and Grain Growth III - Proceedings of the Third International Conference on Recrystallization and Grain Growth, ReX and GG III. PART 1. ed. 2007. p. 351-356 (Materials Science Forum; Vol. 558-559, No. PART 1).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Takata, N, Ikeda, KI, Nakashima, H & Tsuji, N 2007, In-situ EBSP analysis of grain boundary migration during recrystallization in pure aluminum foils. in Recrystallization and Grain Growth III - Proceedings of the Third International Conference on Recrystallization and Grain Growth, ReX and GG III. PART 1 edn, Materials Science Forum, no. PART 1, vol. 558-559, pp. 351-356, 3rd International Conference on Recrystallization and Grain Growth, ReX GG III, Jeju Island, Korea, Republic of, 6/10/07.
Takata N, Ikeda KI, Nakashima H, Tsuji N. In-situ EBSP analysis of grain boundary migration during recrystallization in pure aluminum foils. In Recrystallization and Grain Growth III - Proceedings of the Third International Conference on Recrystallization and Grain Growth, ReX and GG III. PART 1 ed. 2007. p. 351-356. (Materials Science Forum; PART 1).
Takata, Naoki ; Ikeda, Ken Ichi ; Nakashima, Hideharu ; Tsuji, Nobuhiro. / In-situ EBSP analysis of grain boundary migration during recrystallization in pure aluminum foils. Recrystallization and Grain Growth III - Proceedings of the Third International Conference on Recrystallization and Grain Growth, ReX and GG III. PART 1. ed. 2007. pp. 351-356 (Materials Science Forum; PART 1).
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