In-situ EBSP analysis of grain boundary migration during recrystallization in pure aluminum foils

Grain boundary mobility in preferential growth of cube grains ({100}〈001〉) was evaluated by in-situ electron back scattering diffraction pattern (EBSP) analysis in order to clarify the fundamental mechanism of primary recrystallization in pure aluminum foils of 99.9% purity thermo-mechanically processed in the industrial production route for aluminum foils for electrolytic capacitors. We have carried out the continuous EBSP measurements during recrystallization of the aluminum foils heated to various temperatures in the chamber of scanning electron microscopy (SEM). We have succeeded in dynamic observation of the preferential growth of cube grains by the in-situ EBSP analysis. The in-situ EBSP analysis could reveal the migration rate of grain boundaries surrounding the cube grains. It was clarified that the proportional relation between migration rate and annealing time was satisfied. The stored energy providing the driving force for the grain boundary migration during primary recrystallization could be estimated from the misorientation within the deformed grains. The mobility of the grain boundary could be evaluated using the measured grain boundary migration rate and stored energy. Then the activation energy could be estimated by the in-situ EBSP analysis at various temperatures ranging from 270°C to 310°C. The obtained activation energy was 124 kJ/mol, which approximately corresponded to that for the diffusion of impurity such as iron or silicon in aluminum. This suggested that the rate-determining process of the grain boundary migration of cube grains was impurity diffusion in the pure aluminum foils.