In-situ evaluation of nanoparticle diameter for visualizing self-assembly process

Satoshi Ota, Terutake Hayashi, Yasuhiro Takaya

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Self-assembly is one of the few practical methods for fabricating nanostructures. Currently, the fabrication of a nanostructure is determined by the initial conditions such as temperature, concentration of the particle, pH balance, etc. In order to precisely fabricate nanostructure devices using self-assembly, it is necessary to use real-time controlling, which is based on in-situ evaluations. In this study, we have proposed an in-situ particle sizing system to visualize interactions between nanocomponents. The system uses two particle sizing methods to cover a range of particle diameters. In the first method (for diameters of 1-10 nm), particle sizes are evaluated from the rotational diffusion coefficient of Brownian motion using fluorescence polarization. In the second method (for diameters of 10-500 nm), particle sizes are evaluated from the diffusion coefficient of a particle tracking method. The system can be integrated into a fluorescence microscope with a particle tracking system. We constructed an optical system and a particle sizing system and evaluated their properties.

Original languageEnglish
Title of host publicationNinth International Symposium on Laser Metrology
DOIs
Publication statusPublished - Dec 17 2008
Event9th International Symposium on Laser Metrology - , Singapore
Duration: Jun 30 2008Jul 2 2008

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7155
ISSN (Print)0277-786X

Other

Other9th International Symposium on Laser Metrology
CountrySingapore
Period6/30/087/2/08

Fingerprint

Self-assembly
Self assembly
Nanoparticles
self assembly
Nanostructures
nanoparticles
evaluation
Evaluation
Fluorescence
Particle Tracking
Particle size
Particle Size
Brownian movement
sizing
Diffusion Coefficient
Optical systems
Microscopes
Polarization
Particle System
Fabrication

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Ota, S., Hayashi, T., & Takaya, Y. (2008). In-situ evaluation of nanoparticle diameter for visualizing self-assembly process. In Ninth International Symposium on Laser Metrology [71550J] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7155). https://doi.org/10.1117/12.814518

In-situ evaluation of nanoparticle diameter for visualizing self-assembly process. / Ota, Satoshi; Hayashi, Terutake; Takaya, Yasuhiro.

Ninth International Symposium on Laser Metrology. 2008. 71550J (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7155).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ota, S, Hayashi, T & Takaya, Y 2008, In-situ evaluation of nanoparticle diameter for visualizing self-assembly process. in Ninth International Symposium on Laser Metrology., 71550J, Proceedings of SPIE - The International Society for Optical Engineering, vol. 7155, 9th International Symposium on Laser Metrology, Singapore, 6/30/08. https://doi.org/10.1117/12.814518
Ota S, Hayashi T, Takaya Y. In-situ evaluation of nanoparticle diameter for visualizing self-assembly process. In Ninth International Symposium on Laser Metrology. 2008. 71550J. (Proceedings of SPIE - The International Society for Optical Engineering). https://doi.org/10.1117/12.814518
Ota, Satoshi ; Hayashi, Terutake ; Takaya, Yasuhiro. / In-situ evaluation of nanoparticle diameter for visualizing self-assembly process. Ninth International Symposium on Laser Metrology. 2008. (Proceedings of SPIE - The International Society for Optical Engineering).
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