In situ high resolution synchrotron x-ray tomography of fatigue crack closure micromechanisms

K. H. Khor, J. Y. Buffiére, W. Ludwig, Hiroyuki Toda, H. S. Ubhi, P. J. Gregson, I. Sinclair

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The steady state plane strain fatigue crack growth in a 2024-type Al alloy was investigated using in situ high resolution synchrotron radiation x-ray microtomography. A novel microstructural crack displacement gauging method was used to quantify the mixed mode character of crack opening displacement and the closure effect. A liquid gallium grain boundary wetting technique was used in conjunction with the microtomography to visualize the correlation between the fatigue crack behaviour and the three-dimensional (3D) structure of the grains. Electron backscattering diffraction assessment of the grain orientation on the samples was found to provide a uniquely complete 3D description of crack-microstructure interactions.

Original languageEnglish
JournalJournal of Physics Condensed Matter
Issue number33
Publication statusPublished - Aug 25 2004
Externally publishedYes


All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

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