In situ imaging of microstructure formation in electronic interconnections

M. A.A.Mohd Salleh, C. M. Gourlay, J. W. Xian, S. A. Belyakov, H. Yasuda, S. D. McDonald, Kazuhiro Nogita

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

The development of microstructure during melting, reactive wetting and solidification of solder pastes on Cu-plated printed circuit boards has been studied by synchrotron radiography. Using Sn-3.0Ag-0.5Cu/Cu and Sn-0.7Cu/Cu as examples, we show that the interfacial Cu6Sn5layer is present within 0.05 s of wetting, and explore the kinetics of flux void formation at the interface between the liquid and the Cu6Sn5 layer. Quantification of the nucleation locations and anisotropic growth kinetics of primary Cu6Sn5crystals reveals a competition between the nucleation of Cu6Sn5in the liquid versus growth of Cu6 Sn5from the existing Cu6 Sn5 layer. Direct imaging confirms that the β-Sn nucleates at/near the Cu6Sn5layer in Sn-3.0Ag-0.5Cu/Cu joints.

Original languageEnglish
Article number40010
JournalScientific reports
Volume7
DOIs
Publication statusPublished - Jan 12 2017

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wetting
nucleation
microstructure
kinetics
printed circuits
circuit boards
radiography
solders
liquids
electronics
solidification
voids
synchrotrons
melting

All Science Journal Classification (ASJC) codes

  • General

Cite this

Salleh, M. A. A. M., Gourlay, C. M., Xian, J. W., Belyakov, S. A., Yasuda, H., McDonald, S. D., & Nogita, K. (2017). In situ imaging of microstructure formation in electronic interconnections. Scientific reports, 7, [40010]. https://doi.org/10.1038/srep40010

In situ imaging of microstructure formation in electronic interconnections. / Salleh, M. A.A.Mohd; Gourlay, C. M.; Xian, J. W.; Belyakov, S. A.; Yasuda, H.; McDonald, S. D.; Nogita, Kazuhiro.

In: Scientific reports, Vol. 7, 40010, 12.01.2017.

Research output: Contribution to journalArticle

Salleh, MAAM, Gourlay, CM, Xian, JW, Belyakov, SA, Yasuda, H, McDonald, SD & Nogita, K 2017, 'In situ imaging of microstructure formation in electronic interconnections', Scientific reports, vol. 7, 40010. https://doi.org/10.1038/srep40010
Salleh MAAM, Gourlay CM, Xian JW, Belyakov SA, Yasuda H, McDonald SD et al. In situ imaging of microstructure formation in electronic interconnections. Scientific reports. 2017 Jan 12;7. 40010. https://doi.org/10.1038/srep40010
Salleh, M. A.A.Mohd ; Gourlay, C. M. ; Xian, J. W. ; Belyakov, S. A. ; Yasuda, H. ; McDonald, S. D. ; Nogita, Kazuhiro. / In situ imaging of microstructure formation in electronic interconnections. In: Scientific reports. 2017 ; Vol. 7.
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