In situ measurement of capacitance: A method for fabricating nanoglass

Y. Ohta, M. Kitayama, K. Kaneko, S. Toh, F. Shimizu, K. Morinaga

    Research output: Contribution to journalArticlepeer-review

    24 Citations (Scopus)

    Abstract

    The capacitance of the Na 2O-SiO 2 glass was measured in situ during heat treatment at various frequencies, 20, 100, 1, 3, 10, and 30 kHz. It was found that the capacitance of the glass abruptly decreases after a certain duration. The glass was quenched at this stage. It was confirmed by the X-ray diffraction and transmission electron microscopy that this decrease of capacitance was associated with the formation of crystallites in the glass matrix. The size of crystallites was observed to be in the range of about 10 nm.

    Original languageEnglish
    Pages (from-to)1634-1636
    Number of pages3
    JournalJournal of the American Ceramic Society
    Volume88
    Issue number6
    DOIs
    Publication statusPublished - Jun 1 2005

    All Science Journal Classification (ASJC) codes

    • Ceramics and Composites
    • Materials Chemistry

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