In situ third-order interferometric autocorrelation of a femtosecond deep-ultraviolet pulse

Y. Miyoshi, Zaitsu Shin-Ichi, T. Imasaka

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

The interferometric measurement of an ultrashort optical pulse is demonstrated using three-photon ionization of Xe in a time-of-flight mass spectrometer (MS). This approach allowed measurement of the third-order fringeresolved autocorrelation trace of an ultrashort optical pulse in the deep-ultraviolet (DUV) region. The pulse can be measured in situ using the same MS that is employed in ultrafast spectroscopy. Sensitivity (> 3 × 107 W) was sufficient to measure a DUV pulse used in such applications. This setup has the potential to measure the temporal duration of a broadband (204-306 nm) ultrashort optical pulse with no additional distortion in the temporal characteristics.

Original languageEnglish
Pages (from-to)789-794
Number of pages6
JournalApplied Physics B: Lasers and Optics
Volume103
Issue number4
DOIs
Publication statusPublished - Jun 1 2011

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autocorrelation
pulses
mass spectrometers
broadband
ionization
sensitivity
photons
spectroscopy

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

Cite this

In situ third-order interferometric autocorrelation of a femtosecond deep-ultraviolet pulse. / Miyoshi, Y.; Shin-Ichi, Zaitsu; Imasaka, T.

In: Applied Physics B: Lasers and Optics, Vol. 103, No. 4, 01.06.2011, p. 789-794.

Research output: Contribution to journalArticle

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