In situ X-ray photoelectron spectroscopic study of metalloporphyrin- fullerene alternative-deposited thin films

Sou Ryuzaki, Tomohiko Ishii, Jun Onoe

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

In situ X-ray photoelectron spectra (XPS) of metal-octaethylporphyrin [Pd(OEP), Cu(OEP), and Zn(OEP)] and C60 alternative-deposited films on a silicon substrate are presented for the fabrication of high-performance organic thin-film photovoltaic (PV) cells. XPS results indicated that only Zn(PEP) and C60 alternative-deposited films have a layered structure, whereas the other films have a mixed structure. This may be due to the difference in molecular symmetry between the anti-and syn-configurations of M(OEP): Zn(OEP) has a syn-configuration that can be stacked on a C60 film, whereas the other M(OEP)s have an anti-configuration that is difficult to be stacked on the film.

Original languageEnglish
Pages (from-to)5363-5366
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume46
Issue number8 A
DOIs
Publication statusPublished - Aug 6 2007
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

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