Increase in emission current after high-frequency low-voltage pulse application observed for nano-pillar cathode

Tomoya Yoshida, Akiyoshi Baba, Tanemasa Asano

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The increase in emission current after high-frequency low-voltage pulse application to the ion-beam modified organic nano-pillar cold cathode was investigated. It was found that the method was effective to increase the number of emission site without destruction of emitter tip, as the transient current induces heat even at inactive emitter tip. High-frequency low-voltage pulse application increases the number of emission site due to rise in temperature caused by transient current flowing during the application of the pulses. The results also indicated that temperature at the emitter does not rise enough to remove contamination when the frequency was low, as the heat diffusion is higher than the heat generation by transient current.

Original languageEnglish
Title of host publicationTechnical Digest of the 17th International Vacuum Nanoelectronics Conference, IVNC 2004
EditorsA.I. Akinwande, L.-Y. Chen, I. Kymissis, C.-Y. Hong
Pages258-259
Number of pages2
Publication statusPublished - 2004
Externally publishedYes
EventTechnical Digest of the 17th International Vacuum Nanoelectronics Conference, IVNC 2004 - Cambridge, MA, United States
Duration: Jul 11 2004Jul 16 2004

Other

OtherTechnical Digest of the 17th International Vacuum Nanoelectronics Conference, IVNC 2004
CountryUnited States
CityCambridge, MA
Period7/11/047/16/04

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Fingerprint Dive into the research topics of 'Increase in emission current after high-frequency low-voltage pulse application observed for nano-pillar cathode'. Together they form a unique fingerprint.

Cite this