Abstract
The increase in emission current after high-frequency low-voltage pulse application to the ion-beam modified organic nano-pillar cold cathode was investigated. It was found that the method was effective to increase the number of emission site without destruction of emitter tip, as the transient current induces heat even at inactive emitter tip. High-frequency low-voltage pulse application increases the number of emission site due to rise in temperature caused by transient current flowing during the application of the pulses. The results also indicated that temperature at the emitter does not rise enough to remove contamination when the frequency was low, as the heat diffusion is higher than the heat generation by transient current.
| Original language | English |
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| Title of host publication | Technical Digest of the 17th International Vacuum Nanoelectronics Conference, IVNC 2004 |
| Editors | A.I. Akinwande, L.-Y. Chen, I. Kymissis, C.-Y. Hong |
| Pages | 258-259 |
| Number of pages | 2 |
| Publication status | Published - 2004 |
| Event | Technical Digest of the 17th International Vacuum Nanoelectronics Conference, IVNC 2004 - Cambridge, MA, United States Duration: Jul 11 2004 → Jul 16 2004 |
Other
| Other | Technical Digest of the 17th International Vacuum Nanoelectronics Conference, IVNC 2004 |
|---|---|
| Country/Territory | United States |
| City | Cambridge, MA |
| Period | 7/11/04 → 7/16/04 |
All Science Journal Classification (ASJC) codes
- Engineering(all)