Influence of Bi additions on the distinct βsn grain structure of Sn-0.7Cu-0.05Ni-xBi (x = 0-4wt%)

S. A. Belyakov, T. Nishimura, K. Sweatman, K. Nogita, C. M. Gourlay

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Effects of Bi additions to Ag-containing lead-free solders have been the focus of a considerable amount of past investigation. However, the influence of Bi on Sn-Cu-Ni solders has not been studied extensively. In the present study, we explore the influence of Bi on microstructure formation of Sn-0.7Cu-0.05Ni/Cu solder joints both in the bulk and at the interface. It is shown that (i) Sn-0.7Cu-0.05Ni solidifies to produce a markedly different grain structure to Ag-containing lead-free alloys, with 5-8 independent βSn grains in each joint; (ii) Bi additions to Sn-0.7Cu-0.05Ni maintain this distinct βSn grain structure and had no discernible effect on the (Cu,Ni)6Sn5 interfacial intermetallic layers or primary intermetallic crystals.

Original languageEnglish
Title of host publication2016 International Conference on Electronics Packaging, ICEP 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages222-225
Number of pages4
ISBN (Electronic)9784904090176
DOIs
Publication statusPublished - Jun 7 2016
Event2016 International Conference on Electronics Packaging, ICEP 2016 - Hokkaido, Japan
Duration: Apr 20 2016Apr 22 2016

Publication series

Name2016 International Conference on Electronics Packaging, ICEP 2016

Other

Other2016 International Conference on Electronics Packaging, ICEP 2016
CountryJapan
CityHokkaido
Period4/20/164/22/16

Fingerprint

Crystal microstructure
Soldering alloys
Intermetallics
Lead
Crystals
Microstructure
Lead-free solders

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering
  • Mechanics of Materials

Cite this

Belyakov, S. A., Nishimura, T., Sweatman, K., Nogita, K., & Gourlay, C. M. (2016). Influence of Bi additions on the distinct βsn grain structure of Sn-0.7Cu-0.05Ni-xBi (x = 0-4wt%). In 2016 International Conference on Electronics Packaging, ICEP 2016 (pp. 222-225). [7486816] (2016 International Conference on Electronics Packaging, ICEP 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICEP.2016.7486816

Influence of Bi additions on the distinct βsn grain structure of Sn-0.7Cu-0.05Ni-xBi (x = 0-4wt%). / Belyakov, S. A.; Nishimura, T.; Sweatman, K.; Nogita, K.; Gourlay, C. M.

2016 International Conference on Electronics Packaging, ICEP 2016. Institute of Electrical and Electronics Engineers Inc., 2016. p. 222-225 7486816 (2016 International Conference on Electronics Packaging, ICEP 2016).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Belyakov, SA, Nishimura, T, Sweatman, K, Nogita, K & Gourlay, CM 2016, Influence of Bi additions on the distinct βsn grain structure of Sn-0.7Cu-0.05Ni-xBi (x = 0-4wt%). in 2016 International Conference on Electronics Packaging, ICEP 2016., 7486816, 2016 International Conference on Electronics Packaging, ICEP 2016, Institute of Electrical and Electronics Engineers Inc., pp. 222-225, 2016 International Conference on Electronics Packaging, ICEP 2016, Hokkaido, Japan, 4/20/16. https://doi.org/10.1109/ICEP.2016.7486816
Belyakov SA, Nishimura T, Sweatman K, Nogita K, Gourlay CM. Influence of Bi additions on the distinct βsn grain structure of Sn-0.7Cu-0.05Ni-xBi (x = 0-4wt%). In 2016 International Conference on Electronics Packaging, ICEP 2016. Institute of Electrical and Electronics Engineers Inc. 2016. p. 222-225. 7486816. (2016 International Conference on Electronics Packaging, ICEP 2016). https://doi.org/10.1109/ICEP.2016.7486816
Belyakov, S. A. ; Nishimura, T. ; Sweatman, K. ; Nogita, K. ; Gourlay, C. M. / Influence of Bi additions on the distinct βsn grain structure of Sn-0.7Cu-0.05Ni-xBi (x = 0-4wt%). 2016 International Conference on Electronics Packaging, ICEP 2016. Institute of Electrical and Electronics Engineers Inc., 2016. pp. 222-225 (2016 International Conference on Electronics Packaging, ICEP 2016).
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