Influence of D.C. electric field on growth of Arabidopsis thaliana (thale-cress)

T. Okumura; Y. Muramoto; N. Shimizu

doi:10.1109/CEIDP.2010.5724001

Influence of D.C. electric field on growth of Arabidopsis thaliana (thale-cress)

T. Okumura, Y. Muramoto, N. Shimizu

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

6 Citations (Scopus)

Abstract

This paper reports the influence of D.C. electric field on plant growth. In previous paper, we had reported that the D.C. electric field improves the growth of Raphanus sativus longipinnatus (daikon radish). We also reported that the D.C. electric field improves the seed germination rate of Arabidopsis thaliana (thale-cress). In this paper, the results for the thale-cress will be confirmed. Furthermore, we will show the new result that the D.C. electric field exerts no effect on seed germination when the electric potential of the sample is grounded by insertion of the grounded stainless steel plate into the seed bed.

Original language	English
Title of host publication	2010 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2010
DOIs	https://doi.org/10.1109/CEIDP.2010.5724001
Publication status	Published - 2010
Externally published	Yes
Event	2010 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2010 - West Lafayette, IN, United States Duration: Oct 17 2010 → Oct 20 2010

Publication series

Name	Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
ISSN (Print)	0084-9162

Conference

Conference	2010 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2010
Country/Territory	United States
City	West Lafayette, IN
Period	10/17/10 → 10/20/10

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Access to Document

10.1109/CEIDP.2010.5724001

Cite this

Influence of D.C. electric field on growth of Arabidopsis thaliana (thale-cress). / Okumura, T.; Muramoto, Y.; Shimizu, N.

2010 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2010. 2010. 5724001 (Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Okumura, T, Muramoto, Y & Shimizu, N 2010, Influence of D.C. electric field on growth of Arabidopsis thaliana (thale-cress). in 2010 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2010., 5724001, Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP, 2010 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2010, West Lafayette, IN, United States, 10/17/10. https://doi.org/10.1109/CEIDP.2010.5724001

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abstract = "This paper reports the influence of D.C. electric field on plant growth. In previous paper, we had reported that the D.C. electric field improves the growth of Raphanus sativus longipinnatus (daikon radish). We also reported that the D.C. electric field improves the seed germination rate of Arabidopsis thaliana (thale-cress). In this paper, the results for the thale-cress will be confirmed. Furthermore, we will show the new result that the D.C. electric field exerts no effect on seed germination when the electric potential of the sample is grounded by insertion of the grounded stainless steel plate into the seed bed.",

author = "T. Okumura and Y. Muramoto and N. Shimizu",

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AU - Shimizu, N.

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AB - This paper reports the influence of D.C. electric field on plant growth. In previous paper, we had reported that the D.C. electric field improves the growth of Raphanus sativus longipinnatus (daikon radish). We also reported that the D.C. electric field improves the seed germination rate of Arabidopsis thaliana (thale-cress). In this paper, the results for the thale-cress will be confirmed. Furthermore, we will show the new result that the D.C. electric field exerts no effect on seed germination when the electric potential of the sample is grounded by insertion of the grounded stainless steel plate into the seed bed.

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T3 - Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP

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Y2 - 17 October 2010 through 20 October 2010

ER -

Influence of D.C. electric field on growth of Arabidopsis thaliana (thale-cress)

Abstract

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All Science Journal Classification (ASJC) codes

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