Abstract
Metal-insulator transition (MIT) induced by the electric field has been intensively investigated owing to its potential for nano-sized resistance switching devices in the next generation as well as its simple device structure. Although the MIT has been reported in various oxides such as Mn oxide1), Gd oxide2), and Co-doped Ti oxide3), the microscopic origin of the phase transition is still controversial issue. It should be noted that some of the oxides showing the MIT include magnetic components, implying that the MIT is related to the transition of the spin state. To explore the correlation between the MIT and spin configuration, in the present study, we investigate the influence of the ferromagnetic electrode on the MIT.
| Original language | English |
|---|---|
| Title of host publication | 2015 IEEE International Magnetics Conference, INTERMAG 2015 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (Electronic) | 9781479973224 |
| DOIs | |
| Publication status | Published - Jul 14 2015 |
| Event | 2015 IEEE International Magnetics Conference, INTERMAG 2015 - Beijing, China Duration: May 11 2015 → May 15 2015 |
Publication series
| Name | 2015 IEEE International Magnetics Conference, INTERMAG 2015 |
|---|
Other
| Other | 2015 IEEE International Magnetics Conference, INTERMAG 2015 |
|---|---|
| Country | China |
| City | Beijing |
| Period | 5/11/15 → 5/15/15 |
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All Science Journal Classification (ASJC) codes
- Surfaces, Coatings and Films
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering
Cite this
Influence of ferromagnetic electrodes on the resistive switching device based on NiO. / Okabe, K.; Kawakita, M.; Yakata, S.; Kimura, Takashi.
2015 IEEE International Magnetics Conference, INTERMAG 2015. Institute of Electrical and Electronics Engineers Inc., 2015. 7157166 (2015 IEEE International Magnetics Conference, INTERMAG 2015).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Influence of ferromagnetic electrodes on the resistive switching device based on NiO
AU - Okabe, K.
AU - Kawakita, M.
AU - Yakata, S.
AU - Kimura, Takashi
PY - 2015/7/14
Y1 - 2015/7/14
N2 - Metal-insulator transition (MIT) induced by the electric field has been intensively investigated owing to its potential for nano-sized resistance switching devices in the next generation as well as its simple device structure. Although the MIT has been reported in various oxides such as Mn oxide1), Gd oxide2), and Co-doped Ti oxide3), the microscopic origin of the phase transition is still controversial issue. It should be noted that some of the oxides showing the MIT include magnetic components, implying that the MIT is related to the transition of the spin state. To explore the correlation between the MIT and spin configuration, in the present study, we investigate the influence of the ferromagnetic electrode on the MIT.
AB - Metal-insulator transition (MIT) induced by the electric field has been intensively investigated owing to its potential for nano-sized resistance switching devices in the next generation as well as its simple device structure. Although the MIT has been reported in various oxides such as Mn oxide1), Gd oxide2), and Co-doped Ti oxide3), the microscopic origin of the phase transition is still controversial issue. It should be noted that some of the oxides showing the MIT include magnetic components, implying that the MIT is related to the transition of the spin state. To explore the correlation between the MIT and spin configuration, in the present study, we investigate the influence of the ferromagnetic electrode on the MIT.
UR - http://www.scopus.com/inward/record.url?scp=84942474815&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84942474815&partnerID=8YFLogxK
U2 - 10.1109/INTMAG.2015.7157166
DO - 10.1109/INTMAG.2015.7157166
M3 - Conference contribution
AN - SCOPUS:84942474815
T3 - 2015 IEEE International Magnetics Conference, INTERMAG 2015
BT - 2015 IEEE International Magnetics Conference, INTERMAG 2015
PB - Institute of Electrical and Electronics Engineers Inc.
ER -