Influence of grain boundary scattering on the electrical properties of platinum nanofilms

Q. G. Zhang; X. Zhang; B. Y. Cao; M. Fujii; K. Takahashi; T. Ikuta

doi:10.1063/1.2338885

Influence of grain boundary scattering on the electrical properties of platinum nanofilms

Q. G. Zhang, X. Zhang, B. Y. Cao, M. Fujii, K. Takahashi, T. Ikuta

Thermophysics and Fluid Mechanics

Research output: Contribution to journal › Article › peer-review

82 Citations (Scopus)

Abstract

The electrical conductivity and temperature coefficient of resistance of polycrystalline platinum nanofilms have been investigated experimentally and theoretically. The results show that these electrical properties have been greatly reduced mainly by grain boundary scattering. By applying the theory of Mayadas and co-workers [Appl. Phys. Lett. 14, 345 (1969); Phys. Rev. B 1, 1382 (1970)] to predict the electrical conductivity and temperature coefficient of resistance with the same reflection coefficient, however, obvious discrepancies have been found. These discrepancies indicate that Drude's relation for bulk metals cannot be applied directly in the nanosized grain interior of polycrystalline metallic films.

Original language	English
Article number	114102
Journal	Applied Physics Letters
Volume	89
Issue number	11
DOIs	https://doi.org/10.1063/1.2338885
Publication status	Published - 2006

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

Access to Document

10.1063/1.2338885

Cite this

@article{404f9130629047149f90f1d08872fc46,

title = "Influence of grain boundary scattering on the electrical properties of platinum nanofilms",

abstract = "The electrical conductivity and temperature coefficient of resistance of polycrystalline platinum nanofilms have been investigated experimentally and theoretically. The results show that these electrical properties have been greatly reduced mainly by grain boundary scattering. By applying the theory of Mayadas and co-workers [Appl. Phys. Lett. 14, 345 (1969); Phys. Rev. B 1, 1382 (1970)] to predict the electrical conductivity and temperature coefficient of resistance with the same reflection coefficient, however, obvious discrepancies have been found. These discrepancies indicate that Drude's relation for bulk metals cannot be applied directly in the nanosized grain interior of polycrystalline metallic films.",

author = "Zhang, {Q. G.} and X. Zhang and Cao, {B. Y.} and M. Fujii and K. Takahashi and T. Ikuta",

year = "2006",

doi = "10.1063/1.2338885",

language = "English",

volume = "89",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "11",

}

TY - JOUR

T1 - Influence of grain boundary scattering on the electrical properties of platinum nanofilms

AU - Zhang, Q. G.

AU - Zhang, X.

AU - Cao, B. Y.

AU - Fujii, M.

AU - Takahashi, K.

AU - Ikuta, T.

PY - 2006

Y1 - 2006

N2 - The electrical conductivity and temperature coefficient of resistance of polycrystalline platinum nanofilms have been investigated experimentally and theoretically. The results show that these electrical properties have been greatly reduced mainly by grain boundary scattering. By applying the theory of Mayadas and co-workers [Appl. Phys. Lett. 14, 345 (1969); Phys. Rev. B 1, 1382 (1970)] to predict the electrical conductivity and temperature coefficient of resistance with the same reflection coefficient, however, obvious discrepancies have been found. These discrepancies indicate that Drude's relation for bulk metals cannot be applied directly in the nanosized grain interior of polycrystalline metallic films.

AB - The electrical conductivity and temperature coefficient of resistance of polycrystalline platinum nanofilms have been investigated experimentally and theoretically. The results show that these electrical properties have been greatly reduced mainly by grain boundary scattering. By applying the theory of Mayadas and co-workers [Appl. Phys. Lett. 14, 345 (1969); Phys. Rev. B 1, 1382 (1970)] to predict the electrical conductivity and temperature coefficient of resistance with the same reflection coefficient, however, obvious discrepancies have been found. These discrepancies indicate that Drude's relation for bulk metals cannot be applied directly in the nanosized grain interior of polycrystalline metallic films.

UR - http://www.scopus.com/inward/record.url?scp=33748689558&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33748689558&partnerID=8YFLogxK

U2 - 10.1063/1.2338885

DO - 10.1063/1.2338885

M3 - Article

AN - SCOPUS:33748689558

SN - 0003-6951

VL - 89

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 11

M1 - 114102

ER -

Influence of grain boundary scattering on the electrical properties of platinum nanofilms

Abstract

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this