Influence of grain boundary scattering on the electrical properties of platinum nanofilms

Q. G. Zhang, X. Zhang, B. Y. Cao, M. Fujii, K. Takahashi, T. Ikuta

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Abstract

The electrical conductivity and temperature coefficient of resistance of polycrystalline platinum nanofilms have been investigated experimentally and theoretically. The results show that these electrical properties have been greatly reduced mainly by grain boundary scattering. By applying the theory of Mayadas and co-workers [Appl. Phys. Lett. 14, 345 (1969); Phys. Rev. B 1, 1382 (1970)] to predict the electrical conductivity and temperature coefficient of resistance with the same reflection coefficient, however, obvious discrepancies have been found. These discrepancies indicate that Drude's relation for bulk metals cannot be applied directly in the nanosized grain interior of polycrystalline metallic films.

Original languageEnglish
Article number114102
JournalApplied Physics Letters
Volume89
Issue number11
DOIs
Publication statusPublished - Sep 21 2006

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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