TY - JOUR
T1 - Influence of heat treatment on indium-tin-oxide anodes and copper phthalocyanine hole injection layers in organic light-emitting diodes
AU - Fenenko, Larysa
AU - Adachi, Chihaya
N1 - Funding Information:
We are very grateful to Universal Display Corporation (UDC) for financial support of presented work and helpful scientific discussions. We also acknowledge 21st Century COE program of “Molecular Informatics” for financial support of this study.
PY - 2007/4/9
Y1 - 2007/4/9
N2 - Modifications of indium-tin-oxide (ITO) and copper phthalocyanine (CuPc) layers by heat treatment aimed at lowering driving voltage in organic light-emitting diodes (OLEDs) are examined. Significant changes were observed in the surface morphology and carrier injection properties of ITO and CuPc layers after annealing at T = 250 °C for 0-60 min in a glove box. In the case of ITO annealing, although the ITO work function gradually decreased and the surface of the ITO layer became smoother than that of an unannealed ITO layer, we observed an appreciable decrease in the driving voltage with an increase in annealing time. In the case of CuPc annealing, on the other hand, we observed deterioration of the OLED's characteristics. All devices demonstrated an increase in driving voltage due to the pronounced crystallization of the CuPc layer.
AB - Modifications of indium-tin-oxide (ITO) and copper phthalocyanine (CuPc) layers by heat treatment aimed at lowering driving voltage in organic light-emitting diodes (OLEDs) are examined. Significant changes were observed in the surface morphology and carrier injection properties of ITO and CuPc layers after annealing at T = 250 °C for 0-60 min in a glove box. In the case of ITO annealing, although the ITO work function gradually decreased and the surface of the ITO layer became smoother than that of an unannealed ITO layer, we observed an appreciable decrease in the driving voltage with an increase in annealing time. In the case of CuPc annealing, on the other hand, we observed deterioration of the OLED's characteristics. All devices demonstrated an increase in driving voltage due to the pronounced crystallization of the CuPc layer.
UR - http://www.scopus.com/inward/record.url?scp=33847150145&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=33847150145&partnerID=8YFLogxK
U2 - 10.1016/j.tsf.2006.11.116
DO - 10.1016/j.tsf.2006.11.116
M3 - Article
AN - SCOPUS:33847150145
VL - 515
SP - 4812
EP - 4818
JO - Thin Solid Films
JF - Thin Solid Films
SN - 0040-6090
IS - 11
ER -