Influence of hole accumulation on the source resistance, kink effect, and on-state breakdown of InP-based HEMTs: Light irradiation study

T. Suemitsu, H. Fushimi, S. Kodama, S. Tsunashima, S. Kimura

Research output: Contribution to conferencePaperpeer-review

6 Citations (Scopus)

Abstract

The influence of impact-ionized holes accumulating in the device was studied for InP-based InAlAs/InGaAs HEMTs using light irradiation experiments. Two parasitic phenomena arise from the generation of electron-hole pairs and subsequent accumulation of holes in the body of the device: The hole accumulation in the source region causes the decrease in the source resistance, which eliminates the kink effect. The hole accumulation in the gate region shifts the threshold voltage. This could be a positive feedback that increases the drain current at the on-state breakdown of the device.

Original languageEnglish
Pages456-459
Number of pages4
Publication statusPublished - Jan 1 2001
Externally publishedYes
Event2001 International Conference on Indium Phosphide and Related Materials - Nara, Japan
Duration: May 14 2001May 18 2001

Other

Other2001 International Conference on Indium Phosphide and Related Materials
CountryJapan
CityNara
Period5/14/015/18/01

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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