Influence of in-plane 0-45° grain boundary on microwave surface resistance of c-axis YBa2Cu3Oy films on MgO substrate

M. Kusunoki, Y. Takano, M. Mukaida, S. Ohshima

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17 Citations (Scopus)

Abstract

The effect of in-plane 0-45° grain boundaries on surface resistance (Rs) of c-axis YBa2Cu3Oy (YBCO) films on MgO substrates is discussed. Samples that have various densities of 45° rotated grains were prepared using a self-template technique. The Rs values at 22 GHz were measured by the dielectric resonator method using a cryocooler. The Rs systematically changed corresponding to the amount of 0-45° grain boundaries. Conspicuous feature of the films including 0-45° grain boundaries is a large residual surface resistance. The Rs of almost perfectly in-plane aligned YBCO film scaled to 10 GHz were 0.12 mΩ at 20 K and 0.67 mΩ at 77 K on the assumption of tan δ = 0, respectively.

Original languageEnglish
Pages (from-to)81-85
Number of pages5
JournalPhysica C: Superconductivity and its applications
Volume321
Issue number1
DOIs
Publication statusPublished - Aug 1 1999
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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