The effect of in-plane 0-45° grain boundaries on surface resistance (Rs) of c-axis YBa2Cu3Oy (YBCO) films on MgO substrates is discussed. Samples that have various densities of 45° rotated grains were prepared using a self-template technique. The Rs values at 22 GHz were measured by the dielectric resonator method using a cryocooler. The Rs systematically changed corresponding to the amount of 0-45° grain boundaries. Conspicuous feature of the films including 0-45° grain boundaries is a large residual surface resistance. The Rs of almost perfectly in-plane aligned YBCO film scaled to 10 GHz were 0.12 mΩ at 20 K and 0.67 mΩ at 77 K on the assumption of tan δ = 0, respectively.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering